G01N 2021/95653
Through-holes
Official title: {Through-holes}
G01N2021/95653 (Through-holes) appears on 21 US grants and 16 published applications in this corpus.
Search patents in G01N- Granted patents
- 21
- Published applications
- 16
- Assignees
- 19
- Inventors
- 63
- Latest grant
- 13 Jun 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 1 |
| 2012 | 2 | 3 |
| 2013 | 2 | 3 |
| 2014 | 0 | 0 |
| 2015 | 2 | 2 |
| 2016 | 1 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 1 | 1 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Systems and methods for semiconductor chip hole geometry metrology13 Jun 2023US 11,674,909 B2Yangtze Memory Technologies Co., Ltd.
- Systems and methods for semiconductor chip hole geometry metrology22 Jun 2021US 11,041,814 B1Yangtze Memory Technologies Co., Ltd.
- Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometry30 May 2017US 9,664,509 B2Bruker Nano, Inc.
- Printed circuit board4 Oct 2016US 9,462,680 B2Robert Bosch (Australia) Pty Ltd
- Device and method for measuring via hole of silicon wafer1 Sep 2015US 9,121,696 B2Korea Research Institute of Standards and Science
- Inspection device19 Feb 2026US 2026/0049814 A1Saki Corporation
- Systems and methods for semiconductor chip hole geometry metrology23 Sep 2021US 2021/0293727 A1Yangtze Memory Technologies Co., Ltd.
- Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometry16 Apr 2015US 2015/0103357 A1Bruker Nano, Inc.
- Profile measurement system and profile measurement method16 Apr 2015US 2015/0106057 A1Otsuka Electronics Co., Ltd.
- Printed circuit board29 Aug 2013US 2013/0222796 A1Robert Bosch (Australia) Pty Ltd
Most cited
By later US patents
- Method and apparatus for inspecting surface pattern of object41US 5,166,985 AHitachi, Ltd. · 1992
- Method of reading optical image of inspected surface and image reading system employabale therein31US 5,197,105 ADainippon Screen Mfg.Co., Ltd. · 1993
- Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method21US 5,015,097 AHitachi, Ltd. · 1991
- Method for examining foreign matters in through holes16US 7,043,072 B2Seiko Epson Corporation · 2006
- Video bond lead locator12US 5,125,036 AKulicke and Soffa Industries, Inc. · 1992