G01N 2021/95669
For solder coating, coverage
Official title: {for solder coating, coverage}
G01N2021/95669 (For solder coating, coverage) appears on 17 US grants and 19 published applications in this corpus.
Search patents in G01N- Granted patents
- 17
- Published applications
- 19
- Assignees
- 15
- Inventors
- 51
- Latest grant
- 3 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 2 |
| 2003 | 1 | 1 |
| 2004 | 0 | 1 |
| 2005 | 3 | 3 |
| 2006 | 2 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 1 | 1 |
| 2010 | 1 | 1 |
| 2011 | 1 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 2 | 1 |
| 2023 | 0 | 2 |
| 2024 | 2 | 0 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Apparatus, method and recording medium for inspecting coating state of object coated on substrate3 Jun 2025US 12,322,086 B2Koh Young Technology Inc.
- Appearance inspection device and defect inspection method19 Mar 2024US 11,936,985 B2OMRON Corporation
- Measurement machine and method for detecting a defect in solder joints12 Mar 2024US 11,927,436 B2Hewlett Packard Enterprise Development LP
- System and method for inspecting fused plastic pipes20 Sep 2022US 11,448,604 B2WorldWide Nondestructive Testing, Inc
- Apparatus and method of generating control parameter of screen printer5 Jul 2022US 11,379,639 B2Koh Young Technology Inc.
- Apparatus, method and recording medium for inspecting coating state of object coated on substrate16 Nov 2023US 2023/0368370 A1Koh Young Technology Inc.
- Measurement machine and method for detecting a defect in solder joints23 Feb 2023US 2023/0059410 A1Hewlett Packard Enterprise Development LP
- Appearance inspection device and defect inspection method10 Nov 2022US 2022/0360720 A1OMRON Corporation
- System and Method for Inspecting Fused Plastic Pipes14 Jan 2021US 2021/0010951 A1WorldWide Nondestructive Testing, Inc
- Apparatus and method of generating control parameter of screen printer29 Aug 2019US 2019/0269017 A1Koh Young Technology Inc.
Most cited
By later US patents
- Optical inspection system33US 7,075,565 B1Landrex Technologies Co., Ltd. · 2006
- Systems and methods for detecting defects in printed solder paste28US 6,891,967 B2Speedline Technologies, Inc. · 2005
- Optical system21US 6,552,783 B1Teradyne, Inc. · 2003
- Lighting arrangement for automated optical inspection system12US 6,850,637 B1Teradyne, Inc. · 2005
- Inspecting potentially interfering features in a machine vision system11US 8,269,830 B1Mitutoyo Corporation · 2012