Lighting arrangement for automated optical inspection system
AssigneeTeradyne, Inc.
InventorJohn B. Burnett
Life of this patent
Estimating the term…
Abstract
An optical inspection system with an improved illumination system. The improved illumination system used to illustrate the invention has a base formed from a printed circuit board. Substrates for mounting lighting elements, which are exemplified by light emitting diodes, are formed also on printed circuit boards. These circuit boards have serrated edges and the diodes are mounted to the serrations. This configuration allows the light emitting elements to be focused on the focal point. Also in the exemplary illumination system, the light emitting elements have different beam widths so that variations in the illumination intensity as a function of elevation angle are reduced.
Claims16
An optical inspection system having a lighting system and an inspection area, comprising:
- a) a support structure;
- b) a plurality of lighting elements disposed in a planar array with each lighting element having a predetermined spacing from an inspection area, wherein a first portion of the plurality of lighting elements has a predetermined spacing that is greater than the predetermined spacing of a second portion of the plurality of lighting elements and wherein the beam width of the first portion is narrower than the beam width of the second portion.
An optical inspection system having a lighting system and an inspection area, comprising:
- a) a support structure;
- b) a plurality of lighting elements disposed in a planar array with each lighting element having a predetermined spacing from an inspection area, wherein a first portion of the plurality of lighting elements bas a predetermined spacing that is greater than the predetermined spacing of a second portion of the plurality of lighting elements and wherein the beam width of the first portion is narrower than the beam width of the second portion;
- c) wherein the spacing between the lighting elements and the inspection area exceeds 1.8 mm.
An optical inspection system of the type having a plurality of cameras focused on an inspection area and an illumination system illuminating the inspection area, comprising:
- a) a base having a planar surface and a plurality of electrically conducting traces;
- b) a plurality of lighting elements, with the lighting elements positioned in an array parallel with the planar surface, with the lighting elements emitting light towards the inspection area, the array of lighting elements having a plurality of open areas therein, with a first of the open areas located in the center region of the array and at least a second of the open areas offset from the center;
- c) a plurality of cameras directed towards the inspection area, each focused through an open area;
- d) wherein the plurality of lighting elements are electronically connected to the plurality of electrically conducting traces, whereby a plurality of lighting modes can be generated by selection of electrical signals applied to the electrically conducting traces.
Dependencies are inferred from the claim text.