H01J 2237/2818
Scanning tunnelling microscopes
H01J2237/2818 (Scanning tunnelling microscopes) appears on 33 US grants and 25 published applications in this corpus.
Search patents in H01J- Granted patents
- 33
- Published applications
- 25
- Assignees
- 28
- Inventors
- 85
- Latest grant
- 6 Jan 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 1 |
| 2004 | 0 | 0 |
| 2005 | 1 | 1 |
| 2006 | 0 | 1 |
| 2007 | 0 | 1 |
| 2008 | 2 | 3 |
| 2009 | 1 | 0 |
| 2010 | 2 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 2 | 3 |
| 2015 | 3 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 1 |
| 2018 | 2 | 2 |
| 2019 | 2 | 5 |
| 2020 | 1 | 0 |
| 2021 | 3 | 1 |
| 2022 | 1 | 2 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Area selective deposition templated by hydrogen and halogen resists6 Jan 2026US 12,518,967 B1National Technology & Engineering Solutions of Sandia, LLC
- Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software16 May 2023US 11,650,222 B2Board of Regents, The University of Texas System
- Scanning probe and electron microscope probes and their manufacture1 Feb 2022US 11,237,188 B2Tiptek, LLC
- Scanning probe and electron microscope probes and their manufacture9 Nov 2021US 11,169,177 B2Tiptek, LLC
- Methods and devices for examining an electrically charged specimen surface9 Nov 2021US 11,170,970 B2Carl Zeiss SMT GmbH
- Preventing esd in prt sem discharges7 May 2026US 2026/0128251 A1
- Scanning Probe and Electron Microscope Probes and Their Manufacture28 Apr 2022US 2022/0128595 A1Tiptek, LLC
- Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software17 Mar 2022US 2022/0082582 A1Board of Regents, The University of Texas System
- Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software6 May 2021US 2021/0132109 A1Board of Regents, The University of Texas System
- Method for determining the shape of a sample tip for atom probe tomography12 Sep 2019US 2019/0277881 A1Imec Vzw
Most cited
By later US patents
- Variable temperature scanning probe microscope based on a peltier device95US 5,654,546 AMolecular Imaging Corporation · 1997
- Scanning probe microscope apparatus for use in a scanning electron76US 5,455,420 ATopometrix · 1995
- Scanning probe microscope apparatus for use in a scanning electron microscope74US 5,510,615 ATopometrix · 1996
- Tunnel and field effect carrier ballistics41US 4,823,004 ACalifornia Institute of Technology · 1989
- Scanning force microscope to determine interaction forces with high-frequency cantilever32US 6,452,170 B1Case Western Reserve University · 2002