Variable temperature scanning probe microscope based on a peltier device

A scanning probe microscope for examining the surface properties of a sample surface, said microscope comprising:

• a frame;
• a scanner mounted to said frame and suspended therefrom;
• a probe tip mounted to a free end of said scanner;
• at least three adjustable support mounts extending downwardly from said frame;
• each of said three adjustable mounts including a rounded magnetic portion at a distal end thereof;
• a sample platen formed of a material attracted to magnets adapted to be suspended from said rounded magnetic portions of said support mounts;
• a sample stage for receiving a sample surface, said sample stage coupled to said sample platen;
• a Peltier Device thermally coupled to said sample stage for controlling the temperature of said sample stage;
• and
• a hermetically sealed containment enclosing said probe tip, said Peltier Device and said sample stage, said hermetically sealed containment including a flexible sealing member through which said probe tip is extended.

A scanning probe microscope for examining the surface properties of a sample surface, said microscope comprising:

• a frame;
• a piezoelectric scanner having a first end and a second end, said first end attached to said frame;
• a probe tip mounted to said second end of said scanner;
• at least three adjustable support mounts extending downwardly from said frame;
• each of said three adjustable mounts including a rounded magnetic portion at a distal end thereof;
• a sample platen formed of a material attracted to magnets adapted to be suspended from said rounded magnetic portions of said support mounts;
• a sample stage for receiving a sample surface, said sample stage coupled to said sample platen;
• a Peltier Device thermally coupled to said sample stage for controlling the temperature of said sample stage;
• and
• a hermetically sealed containment enclosing said probe tip, said Peltier Device and said sample stage, said hermetically sealed containment including a flexible sealing member through which said probe tip is extended.

A method for performing controlled temperature scanning probe microscopy with a scanning probe microscope having a scanning probe tip suspended from a frame through an aperture in a flexible sealing member into a hermetically sealed containment, said containment also including a sample stage, a Peltier Device for controlling the temperature of said sample stage, and a sample platen to which said Peltier Device is mounted, said sample platen being suspended from said frame, said method comprising the steps of:

• flowing a dry inert gas at room ambient temperature through the containment;
• applying a selected electrical current to the Peltier Device to control the temperature thereof;
• controlling the temperature of a sample disposed on said sample stage with said Peltier Device;
• extending the probe tip through the aperture in the flexible sealing member;
• and
• scanning the probe tip over the surface of the sample in order to determine surface characteristics thereof.

A method for performing controlled temperature scanning probe microscopy with a scanning probe microscope having a scanning probe tip suspended from a frame, extending through an aperture in a flexible sealing member, and disposed in a hermetically sealed containment, said containment also including a sample stage for receiving a sample surface for investigation, said sample stage disposed on a Peltier Device, said Peltier Device for controlling the temperature of said sample stage and being itself disposed on a scanner element for generating relative movement between said probe tip and said sample surface, said method comprising the steps of:

• flowing a dry inert gas at room ambient temperature through the containment;
• applying a selected electrical current to the Peltier Device to control the temperature thereof;
• controlling the temperature of a sample disposed on said sample stage with said Peltier Device;
• extending the probe tip through the aperture in the flexible sealing member;
• and
• causing relative scanning movement between the probe tip and the surface of the sample in order to determine surface characteristics of the sample surface.

A scanning probe microscope for examining the surface properties of a sample surface, said microscope comprising:

• a vertical axis control having a first end mounted to a frame and suspended therefrom;
• a probe tip mounted to a second end of said vertical axis control frame and suspended therefrom;
• a sample stage;
• a Peltier Device thermally coupled to said sample stage for controlling the temperature of said sample stage;
• a scanner element holding said Peltier Device and said sample stage underneath said probe tip, wherein said scanner element provides for scanning in two dimensions;
• and
• a hermetically sealed containment enclosing said probe tip, said Peltier Device and said sample stage, said hermetically sealed containment including a flexible sealing member through which said probe tip is extended.