H01J 2237/2602
Details
H01J2237/2602 (Details) appears on 240 US grants and 236 published applications in this corpus.
Search patents in H01J- Granted patents
- 240
- Published applications
- 236
- Assignees
- 111
- Inventors
- 426
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 5 | 2 |
| 2003 | 5 | 5 |
| 2004 | 6 | 5 |
| 2005 | 5 | 4 |
| 2006 | 1 | 8 |
| 2007 | 3 | 4 |
| 2008 | 4 | 7 |
| 2009 | 9 | 9 |
| 2010 | 4 | 10 |
| 2011 | 6 | 8 |
| 2012 | 11 | 6 |
| 2013 | 2 | 10 |
| 2014 | 15 | 13 |
| 2015 | 20 | 47 |
| 2016 | 30 | 24 |
| 2017 | 23 | 14 |
| 2018 | 16 | 10 |
| 2019 | 15 | 5 |
| 2020 | 10 | 9 |
| 2021 | 5 | 12 |
| 2022 | 7 | 8 |
| 2023 | 4 | 5 |
| 2024 | 6 | 4 |
| 2025 | 5 | 5 |
| 2026 | 5 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Sample holder, electron microscope system and sample observation method18 Aug 2026US 12,712,146 B2Hitachi, Ltd.
- Optical probe system for the electron microscope7 Jul 2026US 12,676,282 B2Waviks, Inc.
- Particle beam system21 Apr 2026US 12,609,272 B2Carl Zeiss Microscopy GmbH
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects10 Mar 2026US 12,570,041 B2Concept Laser GmbH
- Charged particle beam device13 Jan 2026US 12,525,423 B2Hitachi High-Tech Corporation
- Particle beam system13 Aug 2026US 2026/0237594 A1Carl Zeiss Microscopy GmbH
- Secondary electron detector using a conductive ultra-thin membrane provided in an atmospheric pressure electron microscope6 Aug 2026US 2026/0229450 A1Coxem Co., Ltd
- Optical Probe System for the Electron Microscope11 Dec 2025US 2025/0379025 A1Waviks, Inc.
- Liquid sample holder with electrostatic microscope and control method for observing microscopic samples20 Nov 2025US 2025/0357072 A1Tamkang University
- Sample supports and sample cooling systems for cryo-electron microscopy16 Oct 2025US 2025/0321170 A1MiTeGen, LLC
Most cited
By later US patents
- Scanning electron microscope54US 6,590,210 B12003
- Electron detector for use in a gaseous environment53US 4,897,545 AElectroScan Corporation · 1990
- Environmental scanning electron microscope43US 5,362,964 AElectroScan Corporation · 1994
- Environmental scanning electron microscope42US 5,412,211 AElectroScan Corporation · 1995
- Scanning electron microscope for visualization of wet samples40US 4,720,633 AElectro Scan, Inc. · 1988