H01J 2237/2605
Operating at elevated pressures
Official title: operating at elevated pressures, e.g. atmosphere
H01J2237/2605 (Operating at elevated pressures) appears on 163 US grants and 154 published applications in this corpus.
Search patents in H01J- Granted patents
- 163
- Published applications
- 154
- Assignees
- 68
- Inventors
- 255
- Latest grant
- 21 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 5 | 2 |
| 2003 | 5 | 4 |
| 2004 | 5 | 5 |
| 2005 | 5 | 4 |
| 2006 | 1 | 8 |
| 2007 | 3 | 4 |
| 2008 | 4 | 7 |
| 2009 | 9 | 9 |
| 2010 | 4 | 9 |
| 2011 | 6 | 6 |
| 2012 | 11 | 6 |
| 2013 | 2 | 7 |
| 2014 | 12 | 11 |
| 2015 | 12 | 20 |
| 2016 | 15 | 10 |
| 2017 | 11 | 7 |
| 2018 | 7 | 6 |
| 2019 | 7 | 1 |
| 2020 | 5 | 7 |
| 2021 | 3 | 7 |
| 2022 | 5 | 4 |
| 2023 | 2 | 5 |
| 2024 | 2 | 1 |
| 2025 | 3 | 2 |
| 2026 | 3 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Particle beam system21 Apr 2026US 12,609,272 B2Carl Zeiss Microscopy GmbH
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects10 Mar 2026US 12,570,041 B2Concept Laser GmbH
- Charged particle beam device13 Jan 2026US 12,525,423 B2Hitachi High-Tech Corporation
- Charged particle beam device and sample observation method2 Sep 2025US 12,406,824 B2Hitachi High-Tech Corporation
- Pulsed generator of electrically charged particles and method for using a pulsed generator of electrically charged particles15 Apr 2025US 12,278,082 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Particle beam system13 Aug 2026US 2026/0237594 A1Carl Zeiss Microscopy GmbH
- Secondary electron detector using a conductive ultra-thin membrane provided in an atmospheric pressure electron microscope6 Aug 2026US 2026/0229450 A1Coxem Co., Ltd
- Liquid sample holder with electrostatic microscope and control method for observing microscopic samples20 Nov 2025US 2025/0357072 A1Tamkang University
- Charged Particle Beam Apparatus15 May 2025US 2025/0157786 A1Hitachi, Ltd.
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects25 Apr 2024US 2024/0131783 A1Concept Laser GmbH
Most cited
By later US patents
- Scanning electron microscope54US 6,590,210 B12003
- Electron detector for use in a gaseous environment53US 4,897,545 AElectroScan Corporation · 1990
- Environmental scanning electron microscope43US 5,362,964 AElectroScan Corporation · 1994
- Environmental scanning electron microscope42US 5,412,211 AElectroScan Corporation · 1995
- Scanning electron microscope for visualization of wet samples40US 4,720,633 AElectro Scan, Inc. · 1988