H01J 2237/2544
Diffraction [leed]
Official title: Diffraction [LEED]
H01J2237/2544 (Diffraction [leed]) appears on 20 US grants and 11 published applications in this corpus.
Search patents in H01J- Granted patents
- 20
- Published applications
- 11
- Assignees
- 17
- Inventors
- 50
- Latest grant
- 30 Aug 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 1 | 2 |
| 2008 | 3 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 2 |
| 2016 | 1 | 3 |
| 2017 | 2 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 1 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 1 | 1 |
By publication year. Applications have been published since 2001.
Subgroups
Granted patents
Recent patents
- Method and system for generating reciprocal space map30 Aug 2022US 11,430,632 B2FEI Company
- Method of performing electron diffraction pattern analysis upon a sample26 May 2020US 10,663,414 B2Oxford Instruments Nanotechnology Tools Limited
- Imaging of crystalline defects9 Jul 2019US 10,347,462 B2Applied Materials Israel Ltd.
- Image type electron spin polarimeter22 Aug 2017US 9,741,533 B2Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
- LEED for SEM21 Feb 2017US 9,576,770 B2Okinawa Institute of Science and Technology School Corporation
- Method and system for generating reciprocal space map9 Jun 2022US 2022/0181117 A1FEI Company
- Imaging of crystalline defects13 Jun 2019US 2019/0180975 A1Applied Materials Israel Ltd.
- Method of performing electron diffraction pattern analysis upon a sample8 Dec 2016US 2016/0356729 A1Oxford Instruments Nanotechnology Tools Limited
- Image type electron spin polarimeter16 Jun 2016US 2016/0172157 A1Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
- Leed for sem10 Mar 2016US 2016/0071690 A1Okinawa Institute of Science and Technology School Corporation
Most cited
By later US patents
- Double tilt and rotate specimen holder for a transmission electron microscope31US 6,388,262 B1Gatan, Inc. · 2002
- Hierarchical clustering using correlation metric and spatial continuity constraint14US 8,280,887 B1Sandia Corporation · 2012
- Reflection electron diffractometer and method for observing microscopic surface structure13US 5,093,573 A1992
- Computer control of the electron microscope sample stage11US 5,179,280 AChi & Associated Inc. · 1993
- Scanning electron microscope with curved axes11US 7,205,542 B1KLA-Tencor Technologies Corporation · 2007