H01J 2237/255
Reflection diffraction [rheed]
Official title: Reflection diffraction [RHEED]
H01J2237/255 (Reflection diffraction [rheed]) appears on 8 US grants and 3 published applications in this corpus.
Search patents in H01J- Granted patents
- 8
- Published applications
- 3
- Assignees
- 7
- Inventors
- 27
- Latest grant
- 9 Jul 2019
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 2 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Imaging of crystalline defects9 Jul 2019US 10,347,462 B2Applied Materials Israel Ltd.
- Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate12 Jul 2016US 9,390,888 B2Industrial Technology Research Institute
- Hierarchical clustering using correlation metric and spatial continuity constraint2 Oct 2012US 8,280,887 B1Sandia Corporation
- Scanning electron microscope with curved axes17 Apr 2007US 7,205,542 B1KLA-Tencor Technologies Corporation
- Method of determining average crystallite size of material and apparatus and method for preparing thin film of the material16 Jul 2002US 6,420,701 B1Canon Kabushiki Kaisha
- Imaging of crystalline defects13 Jun 2019US 2019/0180975 A1Applied Materials Israel Ltd.
- Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate26 Nov 2015US 2015/0340201 A1Industrial Technology Research Institute
- Systems and Methods for Material Texture Analysis23 Apr 2015US 2015/0109431 A1
Most cited
By later US patents
- Hierarchical clustering using correlation metric and spatial continuity constraint14US 8,280,887 B1Sandia Corporation · 2012
- Reflection electron diffractometer and method for observing microscopic surface structure13US 5,093,573 A1992
- Scanning electron microscope with curved axes11US 7,205,542 B1KLA-Tencor Technologies Corporation · 2007
- Method for identifying surface atoms of solid sample and apparatus therefor9US 5,635,716 AInternational Superconductivity Technology Center · 1997
- Apparatus and method for imaging a particle beam8US 6,198,095 B1Staib Instruments GmbH · 2001