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US 2015/0109431 A1Published application
Systems and Methods for Material Texture Analysis
OwnerStuart I. Wright, Matthew M. Nowell +3inventors
InventorsStuart I. Wright, Matthew M. Nowell, Peter A. de Kloe, Travis Michael Rampton, Patrick Paul Camus
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Abstract
The present inventions are related to systems and methods for determining characteristics of a material. The characteristics may include, but are not limited to, crystallographic texture.
Claims20
A system for determining a crystallographic orientation of a material sample, the system comprising:
- a detector system operable to generate an image corresponding to a location on a surface of a material sample;
- a microprocessor operable to execute instructions to:
- access a data set corresponding to the image;
- using the data set to map locations in the image exhibiting an intensity greater than a threshold intensity to yield an image constellation;
- compare the image constellation with an expected constellation to yield a match indication;
- and
- identify the location on the surface of the material as having a crystallographic orientation corresponding to the expected constellation based upon the match indication.
4 more elements
A method for characterizing a material, the method comprising:
- receiving an image corresponding to a location on a surface of a material sample;
- accessing a data set corresponding to the image;
- using the data set and a microprocessor to map locations in the image exhibiting an intensity greater than a threshold intensity to yield an image constellation;
- comparing the image constellation with an expected constellation to yield a match indication;
- and
- identifying the location on the surface of the material as having a crystallographic orientation corresponding to the expected constellation based upon the match indication.
3 more elements
Dependencies are inferred from the claim text.