H01J 2237/2522
Of electrons
Official title: of electrons (ESCA, XPS)
H01J2237/2522 (Of electrons) appears on 27 US grants and 15 published applications in this corpus.
Search patents in H01J- Granted patents
- 27
- Published applications
- 15
- Assignees
- 24
- Inventors
- 46
- Latest grant
- 17 Oct 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 1 |
| 2003 | 0 | 1 |
| 2004 | 2 | 1 |
| 2005 | 1 | 3 |
| 2006 | 0 | 1 |
| 2007 | 3 | 0 |
| 2008 | 1 | 2 |
| 2009 | 0 | 0 |
| 2010 | 3 | 0 |
| 2011 | 1 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 1 | 2 |
| 2021 | 2 | 2 |
| 2022 | 1 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Variable reduction ratio spherical aberration correction electrostatic lens, wide angle energy analyzer, and two-dimensional electron spectrometer17 Oct 2023US 11,791,148 B2University Corporation National Nara Institute of Science and Technology
- Input lens and electron spectrometer2 Aug 2022US 11,404,260 B2JEOL Ltd.
- Nano vacuum tube19 Oct 2021US 11,152,188 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Hard X-ray photoelectron spectroscopy arrangement and system11 May 2021US 11,002,694 B2Scienta Omicron AB
- Nano vacuum tube18 Feb 2020US 10,566,173 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- Variable reduction ratio spherical aberration correction electrostatic lens, wide angle energy analyzer, and two-dimensional electron spectrometer24 Jun 2021US 2021/0193448 A1National University Corporation Nara Institute of Science and Technology
- Input Lens and Electron Spectrometer1 Apr 2021US 2021/0098244 A1JEOL Ltd.
- Nano vacuum tube21 May 2020US 2020/0161085 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Hard x-ray photoelectron spectroscopy arrangement and system2 Apr 2020US 2020/0103358 A1Scienta Omicron AB
Most cited
By later US patents
- Scanning and high resolution x-ray photoelectron spectroscopy and imaging31US 5,315,113 AThe Perkin-Elmer Corporation · 1994
- Scanning and high resolution electron spectroscopy and imaging26US 5,444,242 APhysical Electronics, Inc. · 1995
- X-ray microscope26US 5,590,168 AOlympus Optical Co., Ltd. · 1996
- X-ray microscope25US 5,450,463 AOlympus Optical Co., Ltd. · 1995
- Apparatus and method for locating target area for electron microanalysis20US 5,118,941 AThe Perkin-Elmer Corporation · 1992