H01J 2237/24485
Energy spectrometers
H01J2237/24485 (Energy spectrometers) appears on 222 US grants and 223 published applications in this corpus.
Search patents in H01J- Granted patents
- 222
- Published applications
- 223
- Assignees
- 88
- Inventors
- 514
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 4 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 7 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 1 |
| 2002 | 0 | 6 |
| 2003 | 2 | 2 |
| 2004 | 5 | 6 |
| 2005 | 5 | 4 |
| 2006 | 9 | 7 |
| 2007 | 8 | 4 |
| 2008 | 4 | 8 |
| 2009 | 5 | 8 |
| 2010 | 6 | 6 |
| 2011 | 8 | 8 |
| 2012 | 9 | 7 |
| 2013 | 14 | 12 |
| 2014 | 8 | 13 |
| 2015 | 7 | 7 |
| 2016 | 9 | 8 |
| 2017 | 12 | 13 |
| 2018 | 8 | 9 |
| 2019 | 9 | 16 |
| 2020 | 17 | 18 |
| 2021 | 22 | 15 |
| 2022 | 7 | 6 |
| 2023 | 10 | 10 |
| 2024 | 7 | 11 |
| 2025 | 7 | 12 |
| 2026 | 3 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Laser-based contrast control in transmission electron microscopy15 Sep 2026US 12,738,449 B2Yeda Research and Development Co. Ltd.
- Electron spectrometer calibration method14 Jul 2026US 12,683,115 B2Ecole Polytechnique Federale De Lausanne (Epfl)
- Augmentation of electron energy loss spectroscopy in charged particle microscopes21 Apr 2026US 12,607,577 B2FEI Company
- EELS auto-alignment using full image simulation23 Dec 2025US 12,505,996 B2FEI Company
- Energy filter, and energy analyzer and charged particle beam device provided with same28 Oct 2025US 12,456,597 B2Hitachi High-Tech Corporation
- Charged particle evaluation system and method for aligning measurements30 Apr 2026US 2026/0118117 A1Applied Materials Israel Ltd.
- Electron beam apparatus and method for generating a pulsed electron beam and applications thereof16 Apr 2026US 2026/0106104 A1MAX-PLANCK-GESELLSCHAFT zur FOERDERUNG der WISSENSCHAFTEN.e.V
- Electron spectroscopy apparatus and methods26 Mar 2026US 2026/0088243 A1
- Scanning electron microscope with enhanced three-dimensional imaging26 Mar 2026US 2026/0088247 A1Samsung Electronics Co., Ltd.
- Method and system for calibrating a charged-particle spectrometer26 Mar 2026US 2026/0088248 A1Centre National De La Recherche Scientifique
Most cited
By later US patents
- Electrical process monitoring using mirror-mode electron microscopy85US 7,514,681 B1KLA-Tencor Technologies Corporation · 2009
- Scanning electron microscope66US 6,847,038 B2Hitachi, Ltd. · 2005
- Apparatus and method for E-beam dark field imaging45US 7,141,791 B2KLA-Tencor Technologies Corporation · 2006
- Apparatus and method for obtaining topographical dark-field images in a scanning electron microscope45US 7,714,287 B1KLA-Tencor Corporation · 2010
- Automated adjustment of an energy filtering transmission electron microscope41US 5,798,524 AGatan, Inc. · 1998