H01J 2237/2445
Photon detectors for x-rays, light
Official title: Photon detectors for X-rays, light, e.g. photomultipliers
H01J2237/2445 (Photon detectors for x-rays, light) appears on 272 US grants and 275 published applications in this corpus.
Search patents in H01J- Granted patents
- 272
- Published applications
- 275
- Assignees
- 128
- Inventors
- 664
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 5 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 4 | 0 |
| 1991 | 5 | 0 |
| 1992 | 4 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 4 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 1 |
| 2002 | 3 | 5 |
| 2003 | 3 | 3 |
| 2004 | 5 | 3 |
| 2005 | 3 | 2 |
| 2006 | 4 | 9 |
| 2007 | 7 | 3 |
| 2008 | 3 | 8 |
| 2009 | 7 | 4 |
| 2010 | 4 | 6 |
| 2011 | 3 | 6 |
| 2012 | 7 | 12 |
| 2013 | 5 | 12 |
| 2014 | 14 | 10 |
| 2015 | 7 | 14 |
| 2016 | 13 | 18 |
| 2017 | 20 | 15 |
| 2018 | 7 | 10 |
| 2019 | 15 | 17 |
| 2020 | 15 | 20 |
| 2021 | 17 | 17 |
| 2022 | 18 | 23 |
| 2023 | 17 | 11 |
| 2024 | 5 | 12 |
| 2025 | 11 | 18 |
| 2026 | 9 | 16 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Fiber optics plate, scintillator panel, radiation detector, electron microscope, X-ray blocking method and electron beam blocking method18 Aug 2026US 12,709,569 B2Hamamatsu Photonics K.K.
- Electron beam monitoring device and electron beam irradiation system18 Aug 2026US 12,712,150 B2Hamamatsu Photonics K.K.
- Method and apparatus for continuous chained energy ion implantation4 Aug 2026US 12,700,562 B2Axcelis Technologies, Inc.
- Blended energy implant9 Jun 2026US 12,651,722 B2Axcelis Technologies, Inc.
- Analysis device, analysis method, and analysis program19 May 2026US 12,633,505 B2HORIBA STEC, Co., Ltd.
- Method and apparatus for continuous chained energy ion implantation1 Oct 2026US 2026/0302126 A1Axcelis Technologies, Inc.
- Blended energy implant17 Sep 2026US 2026/0279718 A1Axcelis Technologies, Inc.
- Charged Particle Beam System27 Aug 2026US 2026/0253834 A1Hitachi High-Tech Corporation
- Scanning electron microscope and photomultiplier therefor and method of evaluating a sample27 Aug 2026US 2026/0253835 A1Applied Materials Israel Ltd.
- Particle beam system13 Aug 2026US 2026/0237594 A1Carl Zeiss Microscopy GmbH
Most cited
By later US patents
- Process for controlling the strike positions of a plurality of electron beams on a melting bath77US 4,988,844 ALeybold Aktiengesellschaft · 1991
- Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus74US 6,107,637 AHitachi, Ltd. · 2000
- Electron beam inspection system and inspection method and method of manufacturing devices using the system67US 6,992,290 B2Ebara Corporation · 2006
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- System for monitoring the position intensity uniformity and directivity of a beam of ionizing radiation37US 4,206,355 AC. G. R. MeV · 1980