H01J 2237/2004
Biological samples
H01J2237/2004 (Biological samples) appears on 54 US grants and 77 published applications in this corpus.
Search patents in H01J- Granted patents
- 54
- Published applications
- 77
- Assignees
- 67
- Inventors
- 202
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 6 |
| 2008 | 1 | 1 |
| 2009 | 2 | 7 |
| 2010 | 2 | 5 |
| 2011 | 4 | 4 |
| 2012 | 3 | 3 |
| 2013 | 1 | 1 |
| 2014 | 2 | 3 |
| 2015 | 3 | 4 |
| 2016 | 4 | 5 |
| 2017 | 4 | 6 |
| 2018 | 2 | 1 |
| 2019 | 2 | 3 |
| 2020 | 6 | 3 |
| 2021 | 1 | 6 |
| 2022 | 6 | 5 |
| 2023 | 1 | 7 |
| 2024 | 3 | 2 |
| 2025 | 2 | 4 |
| 2026 | 3 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly17 Mar 2026US 12,580,149 B2Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- Immunostaining method, sample exchange chamber, and charged particle beam apparatus10 Feb 2026US 12,546,687 B2Hitachi High-Tech Corporation
- Charged particle beam device and sample observation method2 Sep 2025US 12,406,824 B2Hitachi High-Tech Corporation
- Fabricating thin film liquid cells28 Jan 2025US 12,209,979 B2Universiteit Leiden
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly3 Sep 2026US 2026/0260839 A1Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- Liquid sample holder with electrostatic microscope and control method for observing microscopic samples20 Nov 2025US 2025/0357072 A1Tamkang University
- Method for investigating a nanoscale biological specimen in an electron beam instrument, with reduced radiation damage17 Apr 2025US 2025/0123223 A1Bruker AXS GmbH
- Operando scanning electron microscopy platform and methods of using the same27 Mar 2025US 2025/0104960 A1Board of Regents, The University of Texas System
- Environmental cell and electron microscope16 Jan 2025US 2025/0022678 A1Hitachi, Ltd.
Most cited
By later US patents
- Specimen-holding device for electron microscope34US 5,406,087 AJEOL Ltd. · 1995
- Semi-closed observational environment for electron microscope18US 7,388,211 B22008
- Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations17US 7,220,971 B1The University of North Carolina at Chapel Hill · 2007
- Reusable sample holding device permitting ready loading of very small wet samples15US 8,059,271 B2The United States of America as represented by the Secretary of the Army · 2011
- Method of use of reusable sample holding device permitting ready loading of very small wet samples14US 8,102,523 B1The United States of America as represented by the Secretary of the Army · 2012