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US 2025/0104960 A1Published application
Operando scanning electron microscopy platform and methods of using the same
AssigneeBoard of Regents, The University of Texas System
InventorsWen Song, Artur Davletshin
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Abstract
Disclosed herein is an operando scanning electron microscopy platform comprising: a first cell comprising: (a) a sample well configured to receive a solid sample having at least one dimension up to about 20 mm; and (b) one or more electron beam transparent coverings positioned above the solid sample; wherein the platform is sealed and configured to withstand a pressure up to about 10 MPa and a temperature up to about 500° C. Also disclosed are methods of using the same.
Claims20
An operando scanning electron microscopy platform comprising:
- a first cell comprising:
- a) a sample well configured to receive a solid sample;
- and
- b) one or more electron beam transparent coverings positioned above the solid sample;
- wherein the platform is sealed and configured to withstand a pressure up to about 10 MPa and a temperature up to about 1,000° C.
2 more elements
Dependencies are inferred from the claim text.