H01J 2237/04922
Electromagnetic
Official title: electromagnetic
H01J2237/04922 (Electromagnetic) appears on 43 US grants and 44 published applications in this corpus.
Search patents in H01J- Granted patents
- 43
- Published applications
- 44
- Assignees
- 34
- Inventors
- 118
- Latest grant
- 23 Sep 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 1 |
| 2005 | 2 | 1 |
| 2006 | 0 | 1 |
| 2007 | 2 | 0 |
| 2008 | 0 | 1 |
| 2009 | 2 | 3 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 1 |
| 2013 | 1 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 2 |
| 2016 | 2 | 5 |
| 2017 | 1 | 3 |
| 2018 | 2 | 2 |
| 2019 | 6 | 4 |
| 2020 | 3 | 4 |
| 2021 | 1 | 1 |
| 2022 | 6 | 3 |
| 2023 | 1 | 3 |
| 2024 | 1 | 0 |
| 2025 | 2 | 6 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Charged particle beam device, and method for adjusting image capturing conditions in said charged particle beam device23 Sep 2025US 12,424,406 B2Hitachi High-Tech Corporation
- Multiple charged-particle beam apparatus and methods of operating the same using movable lenses1 Jul 2025US 12,347,643 B2ASML Netherlands B. V.
- Methods and apparatuses for adjusting beam condition of charged particles2 Apr 2024US 11,948,772 B2ASML Netherlands B. V.
- Methods and apparatuses for adjusting beam condition of charged particles31 Jan 2023US 11,569,060 B2ASML Netherlands B. V.
- Objective lens arrangement usable in particle-optical systems13 Dec 2022US 11,527,379 B2Applied Materials Israel Ltd.
- Particle beam microscope24 Sep 2026US 2026/0290747 A1
- Ion stripping apparatus with integrated quadrupoles5 Feb 2026US 2026/0038763 A1Axcelis Technologies, Inc.
- Aberration correction in charged particle spectroscopy25 Dec 2025US 2025/0391629 A1
- Electron beam device for surface treatment16 Oct 2025US 2025/0323006 A1
- Multi charged particle beam irradiation apparatus and adjusting method thereof16 Oct 2025US 2025/0323010 A1NuFlare Technology, Inc.
Most cited
By later US patents
- Objective lens arrangement usable in particle-optical systems33US 10,622,184 B2Applied Materials Israel Ltd. · 2020
- Charged particle inspection method and charged particle system32US 10,354,831 B2Applied Materials Israel Ltd. · 2019
- Particle-optical apparatus comprising a detector for secondary electrons21US 5,578,822 AU. S. Philips Corporation · 1996
- Charged particle-optical systems, methods and components21US 8,039,813 B2Applied Materials Israel Ltd. · 2011
- Curvilinear variable axis lens correction with crossed coils12US 5,708,274 AInternational Business Machines Corporation · 1998