H01J 2237/04753
With magnetic means
Official title: with magnetic means
H01J2237/04753 (With magnetic means) appears on 5 US grants and 3 published applications in this corpus.
Search patents in H01J- Granted patents
- 5
- Published applications
- 3
- Assignees
- 5
- Inventors
- 16
- Latest grant
- 10 Dec 2019
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 0 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 1 | 0 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- High performance inspection scanning electron microscope device and method of operating the same10 Dec 2019US 10,504,684 B1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Probe assembly with high bandwidth beam25 Dec 2018US 10,163,601 B1Intel Corporation
- Scanning electron microscope27 Dec 2005US 6,979,821 B2Hitachi, Ltd.
- Scanning electron microscope29 Apr 2003US 6,555,819 B1Hitachi, Ltd.
- Apparatus for ion-plasma machining workpiece surfaces including improved decelerating system16 Nov 1993US 5,262,611 AHauzer Holding B.V.
Most cited
By later US patents
- Apparatus for ion-plasma machining workpiece surfaces including improved decelerating system53US 5,262,611 AHauzer Holding B.V. · 1993
- Scanning electron microscope9US 6,555,819 B1Hitachi, Ltd. · 2003
- Probe assembly with high bandwidth beam2US 10,163,601 B1Intel Corporation · 2018
- Scanning electron microscope1US 6,979,821 B2Hitachi, Ltd. · 2005