G11C 29/838
With substitution of defective spares
Official title: {with substitution of defective spares}
G11C29/838 (With substitution of defective spares) appears on 91 US grants and 72 published applications in this corpus.
Search patents in G11C- Granted patents
- 91
- Published applications
- 72
- Assignees
- 42
- Inventors
- 163
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 2 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 4 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 2 |
| 2002 | 5 | 3 |
| 2003 | 3 | 3 |
| 2004 | 3 | 6 |
| 2005 | 3 | 4 |
| 2006 | 1 | 5 |
| 2007 | 4 | 5 |
| 2008 | 4 | 2 |
| 2009 | 3 | 2 |
| 2010 | 1 | 1 |
| 2011 | 3 | 2 |
| 2012 | 3 | 1 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 4 | 5 |
| 2016 | 2 | 4 |
| 2017 | 4 | 4 |
| 2018 | 4 | 4 |
| 2019 | 4 | 3 |
| 2020 | 3 | 5 |
| 2021 | 1 | 0 |
| 2022 | 1 | 4 |
| 2023 | 3 | 2 |
| 2024 | 5 | 1 |
| 2025 | 1 | 3 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory circuit with memory cells having bistable circuit and non-volatile element25 Aug 2026US 12,718,873 B2Japan Science and Technology Agency
- Replacement of failed memory unit with redundancy memory unit in a memory device and method thereof6 Jan 2026US 12,517,795 B2SK hynix Inc.
- Semiconductor devices for controlling refresh operations considering repair operations18 Nov 2025US 12,475,967 B2SK hynix Inc.
- Electronic bistable circuit with third voltage to retain memory data10 Dec 2024US 12,165,697 B2Japan Science and Technology Agency
- Method and apparatus of testing word line to detect fault after repair14 May 2024US 11,984,176 B2Changxin Memory Technologies, Inc.
- Post Package Repair of Memory with Data Corruption Systems and Methods20 Nov 2025US 2025/0356939 A1Micron Technology, Inc.
- Replacement of failed memory unit with redundancy memory unit in a memory device and method thereof15 May 2025US 2025/0156274 A1SK hynix Inc.
- Electronic circuit6 Feb 2025US 2025/0046365 A1Japan Science and Technology Agency
- Semiconductor devices for controlling refresh operations considering repair operations7 Mar 2024US 2024/0079078 A1SK hynix Inc.
- Reference bits test and repair using memory built-in self-test8 Jun 2023US 2023/0178172 A1Siemens Industry Software Inc.
Most cited
By later US patents
- Field-programmable redundancy apparatus for memory arrays113US 5,153,880 AXicor, Inc. · 1992
- Field-programmable redundancy apparatus for memory arrays58US 5,161,157 AXicor, Inc. · 1992
- Method and apparatus for testing redundant word and bit lines in a memory array41US 5,631,868 AInternational Business Machines Corporation · 1997
- Semiconductor memory device having a redundant memory which can be selectively placed in a not-in-use status39US 5,195,057 AFujitsu Limited · 1993
- Semiconductor memory device37US 5,617,364 AFujitsu Limited · 1997