US 11,984,176 B2 · Method and apparatus of testing word line to detect fault after repair

Abstract

Embodiments of the present disclosure provide a method and an apparatus of testing a word line. After repair of a memory array is completed, if a target word line in a failure state exists in the memory array, a second numerical value is written into the target word line, and then it is determined, according to a numerical value outputted by each word line in the memory array, whether there are at least two word lines in an on-state in the memory array; if there are at least two word lines in an on-state simultaneously in the memory array, a current value generated by the target word line in an on-to-off process is detected; when the current value generated by the target word line in the on-to-off process is greater than a preset current threshold, it is determined that the target word line has a repair fault.

Claims15

Dependent claims

A method of testing a word line, comprising:

after repair of a memory array is completed, detecting whether a target word line in a failure state exists in the memory array;
when a target word line in a failure state exists in the memory array, determining, after a second numerical value is written into the target word line, whether there are at least two word lines simultaneously in an on-state in the memory array according to a numerical value outputted by each word line in the memory array;
when there are at least two word lines simultaneously in an on-state in the memory array, detecting a current value generated by the target word line in an on-to-off process;
and
determining that the target word line has a repair fault, when the current value generated by the target word line in the on-to-off process is greater than a preset current threshold.

2 more elements

An apparatus of testing a word line, comprising:

one or more processors;
and
a storage apparatus, configured to store one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to execute operations of:
detecting, after repair of a memory array is completed, whether a target word line in a failure state exists in the memory array;
determining, when a target word line in a failure state exists in the memory array, after a second numerical value is written into the target word line, whether there are at least two word lines simultaneously in an on-state in the memory array according to a numerical value outputted by each word line in the memory array;
detecting, when there are at least two word lines simultaneously in an on-state in the memory array, a current value generated by the target word line in an on-to-off process;
and
determining that the target word line has a repair fault when the current value generated by the target word line in the on-to-off process is greater than a preset current threshold.

5 more elements

Dependencies are inferred from the claim text.

Method and apparatus of testing word line to detect fault after repair

Life of this patent

Method and apparatus of testing word line to detect fault after repair

Life of this patent

Abstract

Claims15