G11C 2229/763
E-fuses
Official title: E-fuses, e.g. electric fuses or antifuses, floating gate transistors
G11C2229/763 (E-fuses) appears on 40 US grants and 43 published applications in this corpus.
Search patents in G11C- Granted patents
- 40
- Published applications
- 43
- Assignees
- 23
- Inventors
- 79
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2005 | 0 | 1 |
| 2006 | 0 | 4 |
| 2007 | 2 | 5 |
| 2008 | 5 | 5 |
| 2009 | 2 | 3 |
| 2010 | 3 | 3 |
| 2011 | 5 | 5 |
| 2012 | 2 | 3 |
| 2013 | 3 | 0 |
| 2014 | 2 | 3 |
| 2015 | 2 | 0 |
| 2016 | 1 | 1 |
| 2017 | 0 | 1 |
| 2018 | 0 | 0 |
| 2019 | 2 | 1 |
| 2020 | 1 | 1 |
| 2021 | 2 | 1 |
| 2022 | 1 | 2 |
| 2023 | 3 | 0 |
| 2024 | 1 | 3 |
| 2025 | 2 | 0 |
| 2026 | 1 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Static random access memory and its layout pattern5 May 2026US 12,621,974 B2United Microelectronics Corp.
- Memory test system and memory test method7 Jan 2025US 12,190,977 B2Nanya Technology Corporation
- Memory test system and memory test method7 Jan 2025US 12,190,978 B2Nanya Technology Corporation
- Anti-fuse devices and anti-fuse units14 May 2024US 11,985,818 B2Changxin Memory Technologies, Inc.
- Apparatus performing repair operation11 Apr 2023US 11,626,186 B2SK hynix Inc.
- Method of operating static random access memory5 Mar 2026US 2026/0068118 A1United Microelectronics Corp.
- Memory test system and memory test method3 Oct 2024US 2024/0331792 A1Nanya Technology Corporation
- Memory test system and memory test method3 Oct 2024US 2024/0331793 A1Nanya Technology Corporation
- Static random access memory and its layout pattern2 May 2024US 2024/0147683 A1United Microelectronics Corp.
- Anti-fuse devices and anti-fuse units6 Oct 2022US 2022/0320122 A1Changxin Memory Technologies, Inc.
Most cited
By later US patents
- Implementing vertical die stacking to distribute logical function over multiple dies in through-silicon-via stacked semiconductor device41US 8,516,409 B2International Business Machines Corporation · 2013
- Fuses for memory repair39US 7,839,707 B2Vitesse Semiconductor Corporation · 2010
- Component testing and recovery18US 7,404,117 B2Inapac Technology, Inc. · 2008
- Anti-fuse repair control circuit and semiconductor device including DRAM having the same11US 8,023,347 B2Hynix Semiconductor Inc. · 2011
- Modifying memory bank operating parameters10US 10,600,496 B1Micron Technology, Inc. · 2020