Modifying memory bank operating parameters
AssigneeMicron Technology, Inc.
InventorsChristopher G. Wieduwilt, Alan J. Wilson
Life of this patent
Estimating the term…
Abstract
Methods, systems, and devices for modifying memory bank operating parameters are described. Operating parameter(s) may be individually adjusted for memory banks or memory bank groups within a memory system based on trimming information. The local trimming information for a memory bank or memory bank group may be stored in a fuse set that also stores repair information for the particular memory bank or in a fuse set that also stores repair information for a memory bank in the particular memory bank group. The local trimming information may be applied to operating parameters for particular memory banks or memory bank groups relative to or instead of global adjustments applied to operating parameters of multiple or all of the memory banks in the memory system.
Claims18
A method, comprising:
- determining that an operating parameter of a memory bank of a plurality of memory banks is below a threshold;
- storing, in a first fuse set that is coupled with the memory bank, first information for adjusting the operating parameter of the memory bank based at least in part on the determining;
- adjusting the operating parameter for the memory bank based at least in part on the first information stored in the first fuse set;
- and
- adjusting the operating parameter for the plurality of memory banks in a memory system based at least in part on second information stored in a second fuse set.
An apparatus comprising:
- a plurality of memory banks;
- a first fuse set configured to convey first information for adjusting an access parameter of multiple memory banks of the plurality of memory banks;
- a second fuse set configured to convey second information for adjusting the access parameter of a memory bank of the plurality of memory banks;
- and
- a first latch coupled with the second fuse set and the memory bank and configured to receive the second information from the second fuse set and store the second information for the memory bank.
Dependencies are inferred from the claim text.