G01R 31/18
Subjecting similar articles in turn to test
Official title: Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
G01R31/18 (Subjecting similar articles in turn to test) appears on 25 US grants and 18 published applications in this corpus.
Search patents in G01R- Granted patents
- 25
- Published applications
- 18
- Assignees
- 23
- Inventors
- 54
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 2 |
| 2016 | 1 | 1 |
| 2017 | 2 | 2 |
| 2018 | 3 | 1 |
| 2019 | 0 | 1 |
| 2020 | 2 | 2 |
| 2021 | 2 | 0 |
| 2022 | 0 | 1 |
| 2023 | 0 | 0 |
| 2024 | 1 | 1 |
| 2025 | 0 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Methods and systems for component analysis, sorting, and sequencing based on component parameters and devices utilizing the methods and systems4 Jun 2024US 12,002,720 B2Wolfspeed, Inc.
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- Time-dependent dielectric breakdown (tddb) test unit circuit, measurement circuit, and method thereof18 Dec 2025US 2025/0383392 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Methods and systems for component analysis, sorting, and sequencing based on component parameters and devices utilizing the methods and systems22 Aug 2024US 2024/0282645 A1Wolfspeed, Inc.
- Methods and systems for component analysis, sorting, and sequencing based on component parameters and devices utilizing the methods and systems26 May 2022US 2022/0165627 A1Cree Fayetteville, Inc.
- Method of manufacturing a semiconductor device14 May 2020US 2020/0152529 A1Ablic Inc.
Most cited
By later US patents
- Method and instrument for testing the operating characteristics of a capacitor9US 4,267,503 A1981
- Capacitor test apparatus and method8US 3,943,439 AZehntel, Inc. · 1976
- Apparatus for dielectric testing of gloves8US 4,810,971 A1989
- Electrical testing7US 4,583,038 AStandard Telephones and Cables, PLC · 1986
- Scalable highly available modular battery system7US 9,583,794 B2Dell International L.L.C. · 2017