Electrical testing

An apparatus for non-destructive measuring and testing for structural flaws in a dielectric associated with an electrical component, the apparatus including means for applying a mobile ionising solvent to the component so as to penetrate any discontinuity in the dielectric, means for measuring the resistivity of an electrical leakage path associated with an electrical condition of the solvent treated component, and a comparator whereby the measured resistivity is compared with a reference value to provide an indication of the presence or absence of a structural flaw.

A non-destructive process for testing for a dielectric structural flaw in a capacitor, the process including contacting the capacitor with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing the leakage with a reference value to provide an indication of the integrity of the capacitor dielectric.

A non-destructive process for testing for dielectric and insulation flaws in a capacitor comprising a monolithic body to which encapsulation is applied, the process including contacting the capacitor both before and after encapsulation with a mobile ionising solvent, removing the capacitor from contact with the solvent leaving residual solvent trapped in the flaw, measuring an electrical leakage of the capacitor, and comparing this leakage with a reference value to provide an indication of the integrity of the capacitor dielectric and of the encapsulation.