Capacitor test apparatus and method
AssigneeZehntel, Inc.
InventorDouglas W. Raymond
Life of this patent
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AssigneeZehntel, Inc.
InventorDouglas W. Raymond
Estimating the term…
A method and apparatus for the high-speed testing of capacitors. A computing amplifier is connected with the capacitor under test to form an integrator which integrates a known excitation signal. The integration is initiated with no charge stored by the capacitor and at a zero crossing of the excitation signal. The integration occurs over a period which produces the maximum voltage across the capacitor. A peak detector measures the maximum voltage across the capacitor to produce a peak detection voltage inversely proportional to the value of the capacitor and directly proportional to a predetermined nominal value of the capacitor. The reciprocal of the output from the peak detector is formed to provide a measurement directly proportional to the capacitor value and inversely proportional to the nominal value of the capacitor.
An apparatus for measuring the capacitance of a capacitor under test comprising:
An apparatus for measuring the capacitance of a capacitor under test comprising,
A method for measuring the capacitance of a capacitor under test comprising the steps of:
A method for measuring the capacitance of a capacitor under test comprising the steps of:
Dependencies are inferred from the claim text.