G01R 1/44
Modifications of instruments for temperature compensation
G01R1/44 (Modifications of instruments for temperature compensation) appears on 150 US grants and 165 published applications in this corpus.
Search patents in G01R- Granted patents
- 150
- Published applications
- 165
- Assignees
- 114
- Inventors
- 339
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 2 | 2 |
| 2004 | 0 | 6 |
| 2005 | 3 | 4 |
| 2006 | 4 | 4 |
| 2007 | 5 | 6 |
| 2008 | 4 | 7 |
| 2009 | 5 | 7 |
| 2010 | 8 | 3 |
| 2011 | 0 | 3 |
| 2012 | 4 | 2 |
| 2013 | 2 | 9 |
| 2014 | 2 | 6 |
| 2015 | 9 | 11 |
| 2016 | 10 | 12 |
| 2017 | 8 | 7 |
| 2018 | 9 | 12 |
| 2019 | 10 | 7 |
| 2020 | 11 | 8 |
| 2021 | 8 | 9 |
| 2022 | 15 | 10 |
| 2023 | 9 | 10 |
| 2024 | 4 | 8 |
| 2025 | 8 | 4 |
| 2026 | 3 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test fixture and early warning system7 Jul 2026US 12,674,817 B2Triple Win Technology(Shenzhen) Co. Ltd.
- Probe-card multilayer wiring substrate and probe card10 Feb 2026US 12,546,803 B2Japan Electronic Materials Corporation
- Transistor driving a load, and corresponding circuit arrangement for sensing13 Jan 2026US 12,523,681 B2STMicroelectronics S,r.l.
- Pogo pin cooling system and electronic device testing apparatus having the system30 Dec 2025US 12,510,563 B2Chroma Ate Inc.
- Large probe head for testing electronic devices and related manufacturing method2 Dec 2025US 12,487,253 B2Technoprobe S.P.A.
- Probe card for a testing apparatus of electronic devices with improved thermal management16 Jul 2026US 2026/0202440 A1Technoprobe S.P.A.
- Probe card for a testing apparatus of electronic devices16 Jul 2026US 2026/0202441 A1Technoprobe S.P.A.
- Probe head with improved cooling system16 Jul 2026US 2026/0202443 A1Technoprobe S.P.A.
- Probe card with calibrated probe head capacitive distance monitor11 Jun 2026US 2026/0160809 A1FormFactor, Inc.
- Esr and capacitance learning for ultra-capacitor control module11 Jun 2026US 2026/0160824 A1Aptiv Technologies AG
Most cited
By later US patents
- Method and system for compensating thermally induced motion of probe cards130US 7,002,363 B2FormFactor, Inc. · 2006
- Temperature compensated vertical pin probing device69US 6,927,586 B2Wentworth Laboratories, Inc. · 2005
- Apparatus and test device for the application and measurement of prescribed, predicted and controlled contact pressure on wires26US 7,279,916 B2Nanoconduction, Inc. · 2007
- Apparatus and method for terminating probe apparatus of semiconductor wafer25US 6,963,207 B2Celadon Systems, Inc. · 2005
- Electronic circuit with an operating characteristic correcting function22US 6,131,073 ADenso Corporation · 2000