Probe card for a testing apparatus of electronic devices
AssigneeTechnoprobe S.P.A.
InventorFlavio MAGGIONI
Life of this patent
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Abstract
A probe card configured to be mounted in a testing apparatus of electronic devices includes at least one probe head that houses a plurality of contact probes, each contact probe having at least one first end portion configured to abut onto contact pads of a device under test, as well as a main board and an intermediate board connected to the main board , the intermediate board being adapted to perform a distance spatial transformation between contact pads formed on opposite faces thereof and acting as a space transformer. The space transformer comprises at least one core made of a material having a thermal conductivity greater than 100 W/(m·K) to collect and dissipate a heat produced by the probe card during testing operations of the electronic device.
Claims18
A probe card configured to be mounted in a testing apparatus of electronic devices comprising
- a probe head,
- a plurality of contact probes housed into the probe head, each contact probe having a first end portion configured to abut onto contact pads of a device under test,
- a main board, and
- an intermediate board connected to the main board and adapted to realize a distance spatial transformation between contact pads formed on opposite faces thereof and acting as a space transformer,
- wherein the space transformer comprises a core made of a material having a thermal conductivity greater than 100 W/(m·K) to collect and dissipate a heat produced in the probe card during testing operations of the electronic device.
-6. (canceled)
(canceled)
Dependencies are inferred from the claim text.