Transistor driving a load, and corresponding circuit arrangement for sensing
AssigneeSTMicroelectronics S.r.l.
InventorsPlacido De Vita, Salvatore Abbisso, Giovanni Luca Torrisi, Antonio Davide Leone
Life of this patent
Estimating the term…
Loading patent…
AssigneeSTMicroelectronics S.r.l.
InventorsPlacido De Vita, Salvatore Abbisso, Giovanni Luca Torrisi, Antonio Davide Leone
Estimating the term…
A pre-driving stage drives one or more Field Effect Transistors in a power stage driving a load. A method for measuring current flowing in the Field Effect Transistors includes: measuring drain to source voltages of the one or more Field Effect Transistor; and measuring an operating temperature of the one or more Field Effect Transistor. The current flowing in the Field Effect Transistors is measured by: calculating the respective on drain to source resistance at the operating temperature as a function of the measured operating temperature and obtaining the current value as a ratio of the respective measured drain to source voltage over the calculated drain to source resistance at the operating temperature.
A method comprising:
A circuit, comprising:
Dependencies are inferred from the claim text.