G01Q 20/04
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of
Official title: Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
G01Q20/04 (Self-detecting probes, i.e. wherein the probe itself generates a signal representative of) appears on 198 US grants and 140 published applications in this corpus.
Search patents in G01Q- Granted patents
- 198
- Published applications
- 140
- Assignees
- 120
- Inventors
- 418
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 4 | 0 |
| 1993 | 4 | 0 |
| 1994 | 8 | 0 |
| 1995 | 5 | 0 |
| 1996 | 6 | 0 |
| 1997 | 8 | 0 |
| 1998 | 6 | 0 |
| 1999 | 12 | 0 |
| 2000 | 6 | 0 |
| 2001 | 6 | 5 |
| 2002 | 9 | 6 |
| 2003 | 10 | 2 |
| 2004 | 1 | 3 |
| 2005 | 4 | 5 |
| 2006 | 2 | 7 |
| 2007 | 2 | 8 |
| 2008 | 8 | 8 |
| 2009 | 7 | 7 |
| 2010 | 7 | 16 |
| 2011 | 6 | 7 |
| 2012 | 5 | 4 |
| 2013 | 6 | 2 |
| 2014 | 9 | 5 |
| 2015 | 2 | 5 |
| 2016 | 6 | 4 |
| 2017 | 4 | 2 |
| 2018 | 8 | 6 |
| 2019 | 3 | 5 |
| 2020 | 5 | 7 |
| 2021 | 5 | 7 |
| 2022 | 4 | 8 |
| 2023 | 9 | 1 |
| 2024 | 3 | 7 |
| 2025 | 3 | 2 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Automated landing method of a scanning probe microscopy system and scanning probe microscopy system using the same10 Feb 2026US 12,546,800 B2Nearfield Instruments B.V.
- Micro-optomechanical system and method for the production thereof22 Apr 2025US 12,282,040 B2Karlsruher Institut für Technologie
- Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes11 Mar 2025US 12,247,998 B2The Research Foundation for The State University of New York
- Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)4 Mar 2025US 12,241,911 B2Bruker Nano, Inc.
- Micromechanical beam25 Jun 2026US 2026/0176128 A1Nano Analytik GmbH
- Heat Dissipating AFM Probe18 Sep 2025US 2025/0290949 A1Bruker Nano, Inc.
- Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)8 May 2025US 2025/0147066 A1Bruker Nano, Inc.
- Method and apparatus for scanning a sample with a probe26 Dec 2024US 2024/0426869 A1Infinitesima Limited
- Scattering-type scanning near-field optical microscopy with akiyama piezo-probes15 Aug 2024US 2024/0272196 A1The Research Foundation for The State University of New York
Most cited
By later US patents
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993
- Atomic force microscope for high speed imaging including integral actuator and sensor99US 5,883,705 AThe Board of Trustees of the Leland Stanford Jr. University · 1999
- Vibrating probe for a scanning probe microscope91US 6,075,585 AThe Board of Trustees of the Leland Stanford Jr. University · 2000