G01Q 20/00
Monitoring the movement or position of the probe
G01Q20/00 (Monitoring the movement or position of the probe) appears on 641 US grants and 504 published applications in this corpus.
Search patents in G01Q- Granted patents
- 641
- Published applications
- 504
- Assignees
- 301
- Inventors
- 1,108
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 7 | 0 |
| 1992 | 11 | 0 |
| 1993 | 14 | 0 |
| 1994 | 18 | 0 |
| 1995 | 17 | 0 |
| 1996 | 18 | 0 |
| 1997 | 16 | 0 |
| 1998 | 20 | 0 |
| 1999 | 21 | 0 |
| 2000 | 11 | 0 |
| 2001 | 14 | 8 |
| 2002 | 19 | 14 |
| 2003 | 17 | 15 |
| 2004 | 16 | 11 |
| 2005 | 15 | 23 |
| 2006 | 13 | 21 |
| 2007 | 13 | 22 |
| 2008 | 19 | 24 |
| 2009 | 25 | 22 |
| 2010 | 19 | 29 |
| 2011 | 16 | 22 |
| 2012 | 20 | 13 |
| 2013 | 18 | 12 |
| 2014 | 25 | 22 |
| 2015 | 14 | 26 |
| 2016 | 24 | 32 |
| 2017 | 28 | 16 |
| 2018 | 25 | 29 |
| 2019 | 24 | 26 |
| 2020 | 23 | 25 |
| 2021 | 24 | 22 |
| 2022 | 15 | 22 |
| 2023 | 28 | 13 |
| 2024 | 10 | 18 |
| 2025 | 16 | 12 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Grid plate encoder based positioning system and method1 Sep 2026US 12,724,038 B2Nearfield Instruments B.V.
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Automated landing method of a scanning probe microscopy system and scanning probe microscopy system using the same10 Feb 2026US 12,546,800 B2Nearfield Instruments B.V.
- Hybrid near-field scanning microwave microscope18 Nov 2025US 12,474,369 B2Universidade De Aveiro
- Measurement system and probe tip landing method18 Nov 2025US 12,474,371 B2Windbond Electronics Corp.
- Atomic force microscope using a single light source to drive cantilever vibrations and sense cantilever motions13 Aug 2026US 2026/0235642 A1Molecular Vista, Inc.
- System and method for automatically loading and testing afm-probes30 Jul 2026US 2026/0219295 A1Nearfield Instruments B.V.
- Micromechanical beam25 Jun 2026US 2026/0176128 A1Nano Analytik GmbH
- Debris removal from high aspect structures7 May 2026US 2026/0124648 A1Bruker Nano, Inc.
- Apparatus and method for identifying target position in atomic force microscope22 Jan 2026US 2026/0023095 A1Park Systems Corp.
Most cited
By later US patents
- Atomic force microscope and method for imaging surfaces with atomic resolution171US 4,724,318 AInternational Business Machines Corporation · 1988
- Acoustic sensor as proximity detector153US 5,852,232 AKLA-Tencor Corporation · 1998
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994