G01Q 20/02
Monitoring the movement or position of the probe: by optical means
Official title: by optical means
G01Q20/02 (Monitoring the movement or position of the probe: by optical means) appears on 437 US grants and 348 published applications in this corpus.
Search patents in G01Q- Granted patents
- 437
- Published applications
- 348
- Assignees
- 221
- Inventors
- 769
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 5 | 0 |
| 1992 | 7 | 0 |
| 1993 | 12 | 0 |
| 1994 | 10 | 0 |
| 1995 | 14 | 0 |
| 1996 | 12 | 0 |
| 1997 | 7 | 0 |
| 1998 | 15 | 0 |
| 1999 | 11 | 0 |
| 2000 | 6 | 0 |
| 2001 | 9 | 5 |
| 2002 | 11 | 8 |
| 2003 | 8 | 14 |
| 2004 | 14 | 8 |
| 2005 | 12 | 19 |
| 2006 | 11 | 17 |
| 2007 | 11 | 16 |
| 2008 | 13 | 17 |
| 2009 | 20 | 15 |
| 2010 | 14 | 14 |
| 2011 | 10 | 12 |
| 2012 | 16 | 6 |
| 2013 | 9 | 9 |
| 2014 | 14 | 15 |
| 2015 | 9 | 15 |
| 2016 | 13 | 24 |
| 2017 | 18 | 8 |
| 2018 | 13 | 22 |
| 2019 | 19 | 19 |
| 2020 | 20 | 20 |
| 2021 | 21 | 16 |
| 2022 | 11 | 15 |
| 2023 | 21 | 11 |
| 2024 | 6 | 11 |
| 2025 | 12 | 8 |
| 2026 | 2 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Hybrid near-field scanning microwave microscope18 Nov 2025US 12,474,369 B2Universidade De Aveiro
- System, method, computer-accessible medium and apparatus for DNA mapping28 Oct 2025US 12,455,296 B2The University of Bristol
- Arrangement for and method of determining cantilever deflection in a scanning probe microscopy system30 Sep 2025US 12,429,496 B2Nearfield Instruments B.V.
- Atomic force microscope using a single light source to drive cantilever vibrations and sense cantilever motions13 Aug 2026US 2026/0235642 A1Molecular Vista, Inc.
- System and method for automatically loading and testing afm-probes30 Jul 2026US 2026/0219295 A1Nearfield Instruments B.V.
- Debris removal from high aspect structures7 May 2026US 2026/0124648 A1Bruker Nano, Inc.
- Apparatus and method for identifying target position in atomic force microscope22 Jan 2026US 2026/0023095 A1Park Systems Corp.
- Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation18 Sep 2025US 2025/0290948 A1Bruker Nano, Inc.
Most cited
By later US patents
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993
- Method of performing lithography using cantilever array111US 5,666,190 AThe Board of Trustees of the Leland Stanford Jr. University · 1997
- Imaging apparatus and method104US 5,047,633 AAmersham International plc · 1991
- Double cantilever sensor for atomic force microscope104US 5,267,471 AIBM Corporation · 1993