G01N 23/2257
Measuring excited x-rays, i.e. particle-induced x-ray emission [pixe]
Official title: Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]
G01N23/2257 (Measuring excited x-rays, i.e. particle-induced x-ray emission [pixe]) appears on 14 US grants and 19 published applications in this corpus.
Search patents in G01N- Granted patents
- 14
- Published applications
- 19
- Assignees
- 17
- Inventors
- 52
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 3 |
| 2019 | 1 | 1 |
| 2020 | 1 | 0 |
| 2021 | 0 | 2 |
| 2022 | 1 | 0 |
| 2023 | 1 | 2 |
| 2024 | 1 | 3 |
| 2025 | 0 | 3 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Particle-induced x-ray emission using light and heavy particle beams11 Aug 2026US 12,704,469 B2FEI Company
- Surface analysis method and surface analysis apparatus28 Jul 2026US 12,693,248 B2Shimadzu Corporation
- Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams13 Aug 2024US 12,061,159 B2FEI Company
- System and method of preparing integrated circuits for backside probing using charged particle beams14 Mar 2023US 11,605,525 B2FEI Company
- MeV-based ion beam analysis apparatus22 Feb 2022US 11,255,803 B2Forschungszentrum Juelich GmbH
- Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurements17 Jul 2025US 2025/0231132 A1Applied Materials Israel Ltd.
- Particle-induced x-ray emission using light and heavy particle beams12 Jun 2025US 2025/0189469 A1FEI Company
- Surface Analysis Method and Surface Analysis Apparatus16 Jan 2025US 2025/0020603 A1Shimadzu Corporation
- Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams19 Dec 2024US 2024/0418660 A1FEI Company
- Magnetic Deflector and Methods of Use Thereof19 Dec 2024US 2024/0418662 A1University of North Texas
Most cited
By later US patents
- Bulk material analyser for on-conveyor belt analysis23US 6,362,477 B1Commonwealth Scientific and Industrial Research Organisation · 2002
- X-ray radiography with highly charged ions16US 6,115,452 AThe Regents of the University of California · 2000
- Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing same6US 8,729,471 B2Pulsetor, LLC · 2014
- Thin film forming apparatus4US 5,305,366 AMitsubishi Denki Kabushiki Kaisha · 1994
- Method and system for analysis of objects2US 10,705,036 B2Institut National De La Recherche Scientifique · 2020