G01N 2223/646
Flaws, defects
Official title: flaws, defects
G01N2223/646 (Flaws, defects) appears on 331 US grants and 430 published applications in this corpus.
Search patents in G01N- Granted patents
- 331
- Published applications
- 430
- Assignees
- 222
- Inventors
- 1,124
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 3 |
| 2008 | 0 | 0 |
| 2009 | 0 | 2 |
| 2010 | 1 | 4 |
| 2011 | 2 | 2 |
| 2012 | 2 | 9 |
| 2013 | 4 | 9 |
| 2014 | 8 | 12 |
| 2015 | 10 | 12 |
| 2016 | 11 | 10 |
| 2017 | 14 | 34 |
| 2018 | 19 | 15 |
| 2019 | 21 | 33 |
| 2020 | 23 | 40 |
| 2021 | 42 | 44 |
| 2022 | 31 | 52 |
| 2023 | 47 | 39 |
| 2024 | 36 | 33 |
| 2025 | 35 | 45 |
| 2026 | 20 | 31 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Dust hood hold down22 Sep 2026US 12,741,328 B2Eagle Machinery & Supply, Inc.
- Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured component15 Sep 2026US 12,736,483 B2General Electric Company
- Target X-ray inspection system and method1 Sep 2026US 12,723,994 B2Viken Detection Corporation
- X-ray measuring method and X-ray measuring device for measuring a strand1 Sep 2026US 12,723,995 B2CiTEX Holding GmbH
- Stack cell for easy confirmation of separator folding, separator inspection device and inspection method1 Sep 2026US 12,725,841 B2LG Energy Solution, Ltd.
- Material inspection and testing process using a radio opaque penetrant17 Sep 2026US 2026/0276563 A1Illinois Tool Works Inc.
- Conveyance device and article inspection apparatus including the conveyance device27 Aug 2026US 2026/0251589 A1Ishida Co., Ltd.
- Method, electronic device, and system for detecting defect of solder paste27 Aug 2026US 2026/0251590 A1Wiwynn Corporation
- Control device, x-ray inspection device, control method, and control program for defect inspection27 Aug 2026US 2026/0251591 A1Ishida Co., Ltd.
- Method and program for calculating small-angle x-ray scattering intensity distribution6 Aug 2026US 2026/0227349 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Computerized tomographic x-ray scanner system and gantry assembly173US 5,014,293 AImatron, Inc. · 1991
- X-ray tomographic image magnification process, system and apparatus therefor55US 5,245,648 AThe United States of America as represented by the United States Department of Energy · 1993
- Apparatus of plural charged particle beams with multi-axis magnetic lens39US 8,294,095 B2Hermes Microvision, Inc. · 2012
- Defect correction using tomographic scanner for additive manufacturing32US 9,835,568 B2General Electric Company · 2017
- Apparatus for materials testing of test objects using X-rays27US 9,341,546 B2GE Sensing & Inspection Technologies GmbH · 2016