Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured component
AssigneeGeneral Electric Company
InventorsMohamed Rahmane, Andrey I. Meshkov, Vladimir A. Lobastov, William R. Ross
Life of this patent
Estimating the term…
Abstract
The present disclosure is directed to an additive manufacturing system configured to generate an electron beam directed toward a target to generate x-ray flux. The x-ray flux is directed toward the component through at least one plate with a pinhole. Interactions between the component and the x-ray flux generate x-ray radiation. The at least one detector is configured to detect the x-ray radiation through a pinhole. An analysis component is configured to generate an image comprising a three-dimensional component based on the x-ray radiation detected by the at least detector.
Claims20
An apparatus for in-situ inspection, comprising:
- an electron emitter configured to emit electrons such that the electrons penetrate a component, wherein the electrons move along an electron path between the electron emitter and the component;
- a target positioned between the electron emitter and the component at an angle with respect to the component such that interaction between the target and the electrons generates a multidirectional x-ray flux;
- a plate defining a pinhole therethrough, positioned along the electron path between the target and the component such that the multidirectional x-ray flux is directed through the pinhole toward the component positioned with respect to the angle to direct an x-ray flux onto the component;
- and
- at least one detector positioned to detect x-ray radiation from the x-ray flux that penetrates the component, wherein the x-ray radiation is converted to coordinates that correspond to a spatial reference comprising a three-dimensional area of the component.
An additive manufacturing system, comprising:
- a process chamber for manufacturing a component;
- and
- an apparatus for in-situ inspection, comprising:
- an electron beam source configured to emit an electron beam such that the electron beam penetrates the component, wherein the electron beam moves along an electron beam path between the electron beam source and the component;
- a target positioned along the electron beam path between the electron beam source and the component at an angle with respect to the component such that interaction between the target and the electron beam generates a multidirectional x-ray flux;
- a plate defining a pinhole therethrough, positioned along the electron beam path between the target and the component such that the multidirectional x-ray flux is directed through the pinhole toward a component positioned with respect to the angle to direct an x-ray flux onto the component;
- and
- at least one detector positioned to detect x-ray radiation generated from the x-ray flux that penetrates the component, wherein the x-ray radiation is converted to coordinates that correspond to a spatial reference comprising a three-dimensional area of the component.
A method of in-situ inspection of an additively manufactured component, the method comprising:
- emitting an electron beam from an electron beam source to penetrate a component, wherein the electron beam moves along an electron beam path between the electron beam source and the component;
- directing the electron beam using a target at an angle such that interaction between the target and the electron beam generate a multidirectional x-ray flux;
- directing the multidirectional x-ray flux to a plate defining pinhole therethrough such that the multidirectional x-ray flux is directed through the pinhole toward a component positioned with respect to the angle to direct an x-ray flux onto the component;
- and
- detecting, with at least one detector, x-ray radiation from the x-ray flux penetrating a component at coordinates, wherein the coordinates indicate a spatial reference comprising a three-dimensional area of the component.
Dependencies are inferred from the claim text.