G01N 2223/6466
Flaws comparing to predetermined standards
Official title: flaws comparing to predetermined standards
G01N2223/6466 (Flaws comparing to predetermined standards) appears on 32 US grants and 39 published applications in this corpus.
Search patents in G01N- Granted patents
- 32
- Published applications
- 39
- Assignees
- 30
- Inventors
- 95
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 1 | 2 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 2 | 2 |
| 2014 | 1 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 2 | 2 |
| 2018 | 3 | 3 |
| 2019 | 0 | 1 |
| 2020 | 0 | 1 |
| 2021 | 3 | 9 |
| 2022 | 2 | 2 |
| 2023 | 9 | 3 |
| 2024 | 3 | 2 |
| 2025 | 5 | 7 |
| 2026 | 1 | 2 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Method for determining the presence of one defect on a tomographic image of a three-dimensional part by breaking the image down into principal components4 Aug 2026US 12,700,083 B2Association pour la Recherche et le Developpement des Methodes et Processus Industriels A.R.M.I.N.E.S.
- Computer-implemented method for monitoring the status of a device for investigating objects26 Aug 2025US 12,399,137 B2Volume Graphics GmbH
- Adaptive manufacturing using CT scan data29 Jul 2025US 12,370,603 B2Pratt & Whitney Canada Corp.
- Method and system for inspecting quality of tire member10 Jun 2025US 12,325,202 B2The Yokohama Rubber Co., Ltd.
- Methods and systems for defects detection and classification using X-rays20 May 2025US 12,307,668 B2Bruker Nano, Inc.
- Article inspection device14 May 2026US 2026/0133142 A1Anritsu Corporation
- Backscatter x-ray system and method12 Feb 2026US 2026/0043758 A1The Boeing Company
- X-ray diffraction inspection system and method for operating same18 Dec 2025US 2025/0383307 A1Rtx Corporation
- Adaptive manufacturing using ct scan data13 Nov 2025US 2025/0345856 A1Pratt & Whitney Canada Corp.
- Method of calculating indicator of thin wire, method of evaluating quality of optical cable, and optical cable13 Nov 2025US 2025/0347584 A1Sumitomo Electric Industries, Ltd.
Most cited
By later US patents
- Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards5US 8,532,952 B2Concurrent Technologies Corporation · 2013
- Methods and systems for printed circuit board design based on automatic corrections4US 11,042,981 B2SVXR, Inc. · 2021
- Methods and systems for detecting defects in devices using X-rays4US 11,688,067 B2Bruker Nano, Inc. · 2023
- Agricultural sizer with item stabilizer belt4US 9,927,377 B22018
- Methods and systems for process control based on X-ray inspection3US 11,430,118 B2Bruker Nano, Inc. · 2022