Apparatus for materials testing of test objects using X-rays
AssigneeGE Sensing & Inspection Technologies GmbH
InventorsIngo Stuke, Til Florian Guenzler, Michael Wuestenbecker, Jan Kraemer, Holger Lux, Nicolas Bretzke
Life of this patent
Estimating the term…
Abstract
An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.
Claims19
An apparatus for materials testing of a test object using X-rays, the apparatus comprising:
- a carrier having a first surface and a second surface;
- an X-ray device comprising an X-ray source for irradiation of the test object held in a test position on the first surface of the carrier;
- an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object, the detection sections arranged at an angle to each other, at least a first detection section arranged to face a horizontal surface of the test object and at least a second detection section arranged to face a vertical surface of the test object;
- and
- an electronic control device configured to control the X-ray device,
- wherein during X-ray testing to acquire a complete overall cross-section of the test object, the carrier is configured to rotate relative to the X-ray device and the X-ray linear diode array detector only around a vertical axis of rotation while the X-ray device and the X-ray linear diode array detector remain stationary, the carrier to rotate while acquisition of the overall cross-section of the test object is actively occurring.
An apparatus for materials testing, of a test object using X-rays, the apparatus comprising:
- a carrier having a first surface and a second surface;
- an X-ray device comprising an X-ray source for irradiation of the test object held in a test position on the first surface of the carrier;
- an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object, the detection sections arranged at an angle to each other, at least a first detection section arranged to face a horizontal surface of the test object and at least a second detection section arranged to face a vertical surface of the test object;
- and
- an electronic control device configured to control the X-ray device,
- wherein during X-ray testing to acquire a complete overall cross-section of the test object, the X-ray device and the X-ray linear diode array detector are configured to rotate relative to the carrier only around a vertical axis of rotation while the carrier remains stationary.
Dependencies are inferred from the claim text.