G01N 2223/645
Quality control
Official title: quality control
G01N2223/645 (Quality control) appears on 102 US grants and 139 published applications in this corpus.
Search patents in G01N- Granted patents
- 102
- Published applications
- 139
- Assignees
- 109
- Inventors
- 343
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 2 |
| 2010 | 1 | 2 |
| 2011 | 1 | 1 |
| 2012 | 0 | 2 |
| 2013 | 1 | 0 |
| 2014 | 2 | 2 |
| 2015 | 1 | 4 |
| 2016 | 3 | 2 |
| 2017 | 2 | 4 |
| 2018 | 3 | 8 |
| 2019 | 6 | 7 |
| 2020 | 7 | 20 |
| 2021 | 16 | 14 |
| 2022 | 7 | 16 |
| 2023 | 13 | 18 |
| 2024 | 22 | 13 |
| 2025 | 9 | 16 |
| 2026 | 7 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- Detection apparatus and battery production device9 Jun 2026US 12,650,392 B2Contemporary Amperex Technology Co., Limited
- X-ray inspection apparatus and inspection method of x-ray sensor unit28 Apr 2026US 12,611,150 B2Ishida Co., Ltd.
- Electrode tab alignment mechanism and X-ray inspection apparatus comprising same for inspecting cylindrical secondary battery28 Apr 2026US 12,613,200 B2Innometry Co., Ltd.
- Method and system utilizing imaging analysis for golf balls31 Mar 2026US 12,589,282 B1Callaway Golf Company
- X-ray inspection device and preventive maintenance device therefor1 Oct 2026US 2026/0298843 A1Anritsu Corporation
- Image management system, sample selection method, image management device, image display device, and program24 Sep 2026US 2026/0287523 A1Konica Minolta, Inc.
- X-ray system and ct system28 May 2026US 2026/0146961 A1Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
- Image management system, image management device, image management method, and image management program26 Feb 2026US 2026/0056143 A1Konica Minolta, Inc.
- Backscatter x-ray system and method12 Feb 2026US 2026/0043758 A1The Boeing Company
Most cited
By later US patents
- Apparatus for materials testing of test objects using X-rays27US 9,341,546 B2GE Sensing & Inspection Technologies GmbH · 2016
- X-ray device, method, manufacturing method for structure, program, and recording medium on which program is recorded23US 10,190,997 B2Nikon Corporation · 2019
- Scatterometry-based imaging and critical dimension metrology21US 9,494,535 B2KLA-Tencor Corporation · 2016
- Amplified backscatter x-ray inspection system14US 9,036,781 B1The Boeing Company · 2015
- System and method using x-rays for depth-resolving metrology and analysis12US 11,549,895 B2Sigray, Inc. · 2023