X-ray device, method, manufacturing method for structure, program, and recording medium on which program is recorded
AssigneeNikon Corporation
InventorTakashi Aoki
Life of this patent
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AssigneeNikon Corporation
InventorTakashi Aoki
Estimating the term…
There is provided an X-ray device irradiating a measuring object with X-ray and detecting transmission X-ray transmitted through the measuring object, the X-ray device including: a first information generation portion configured to generate first information in which a value according to an absorption coefficient is allocated to each of a plurality of divided sections into which there is divided a predetermined space including at least part of the measuring object; a frequency generation portion configured to generate frequency information of the allocated value to indicate a number of the divided sections according to magnitude of the allocated value in the first information; a ratio acquirement portion configured to acquire ratio information indicating a ratio between a first substance and a second substance constituting the measuring object; and a second information generation portion configured to change the first information into second information, by using the frequency information and the ratio information.
An X-ray device comprising:
A method for acquiring information related to a structure of a measuring object by irradiating the measuring object with X-ray, the method comprising:
A non-transitory computer-readable recording medium storing a computer program configured to cause a computer connected to an X-ray device to carry out a control of the X-ray device, the computer program comprising instructions for controlling the X-ray device to carry out:
Dependencies are inferred from the claim text.