Back to results
US 9,036,781 B1Granted
Amplified backscatter x-ray inspection system
AssigneeThe Boeing Company
InventorMorteza Safai
Life of this patent
Estimating the term…
Abstract
A method and apparatus for inspecting an object. A radiation generation system is configured to emit radiation. A detector system is configured to detect backscatter formed in response to the radiation encountering the object. A redirection system is positioned relative to the detector system and is configured to redirect the backscatter to the detector system.
Claims20
An apparatus comprising:
- a radiation generation system configured to emit x rays;
- a detector system configured to detect backscatter formed in response to the x-rays encountering an object, the detector system comprising sensors;
- and
- a redirection system positioned relative to the detector system and configured to redirect the backscatter to the detector system, the redirection system comprising redirection structures, and wherein the sensors of the detector system are positioned between the redirection structures of the redirection system and the object.
1 more element
A method for inspecting an object, the method comprising:
- emitting x-rays from a radiation source;
- and
- redirecting backscatter from the x-rays encountering the object to a detector system using a redirection system positioned relative to the detector system, wherein sensors of the detector system are positioned between redirection structures of the redirection system and the object.
Dependencies are inferred from the claim text.