G01N 2223/61
Thin films, coatings
Official title: thin films, coatings
G01N2223/61 (Thin films, coatings) appears on 91 US grants and 109 published applications in this corpus.
Search patents in G01N- Granted patents
- 91
- Published applications
- 109
- Assignees
- 88
- Inventors
- 301
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 1 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 4 |
| 2013 | 2 | 5 |
| 2014 | 1 | 5 |
| 2015 | 7 | 7 |
| 2016 | 6 | 2 |
| 2017 | 3 | 11 |
| 2018 | 6 | 9 |
| 2019 | 11 | 4 |
| 2020 | 5 | 8 |
| 2021 | 7 | 11 |
| 2022 | 4 | 12 |
| 2023 | 9 | 10 |
| 2024 | 10 | 6 |
| 2025 | 7 | 11 |
| 2026 | 4 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Bonding wire for semiconductor devices8 Sep 2026US 12,733,530 B2Nippon Micrometal Corporation
- Method for analyzing quality of thin surface layer of PCB19 May 2026US 12,631,580 B2Guangzhou Termbray Electronics Tech Co., Ltd.
- Information processing apparatus, information processing method, nontransitory computer readable media storing program, and X-ray analysis apparatus24 Mar 2026US 12,584,871 B2Rigaku Corporation
- Information processing apparatus, information processing method, non-transitory computer readable media storing program, and X-ray analysis apparatus3 Mar 2026US 12,566,146 B2Rigaku Corporation
- Substrate alloy influence compensation16 Sep 2025US 12,416,590 B2Thermo Fisher Scientific Messtechnik GmbH
- Method and device for producing nanopores30 Apr 2026US 2026/0116742 A1The University of Tokyo
- Method for determining a deformation field of at least one layer of paint applied to a support during crosslinking of the layer or the layers of paint5 Feb 2026US 2026/0036531 A1Airbus SAS
- Open-air, variable-temperature x-ray diffractometer11 Dec 2025US 2025/0377319 A1King Fahd University of Petroleum and Minerals
- Blade tip wear detection system and methods for aerospace components13 Nov 2025US 2025/0347593 A1Rtx Corporation
- Tool for Analysing the Chemical Composition and Structure of Nanolayers25 Sep 2025US 2025/0297973 A1Imec Vzw
Most cited
By later US patents
- X-ray photoelectron emission spectrometry system47US 5,280,176 AThe United States of America as represented by the Secretary of Commerce · 1994
- X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer34US 7,258,485 B2Rigaku Corporation · 2007
- X-ray thin film inspection device27US 10,473,598 B2Rigaku Corporation · 2019
- In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growth23US 8,513,603 B1West Virginia University · 2013
- Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)23US 9,551,677 B2Bruker Jv Israel Ltd. · 2017