G01N 2223/331
Rocking curve analysis
Official title: rocking curve analysis
G01N2223/331 (Rocking curve analysis) appears on 10 US grants and 10 published applications in this corpus.
Search patents in G01N- Granted patents
- 10
- Published applications
- 10
- Assignees
- 11
- Inventors
- 49
- Latest grant
- 7 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 1 | 3 |
| 2016 | 1 | 0 |
| 2017 | 1 | 0 |
| 2018 | 1 | 0 |
| 2019 | 0 | 0 |
| 2020 | 1 | 1 |
| 2021 | 1 | 2 |
| 2022 | 1 | 2 |
| 2023 | 1 | 1 |
| 2024 | 1 | 0 |
| 2025 | 1 | 0 |
By publication year.
Recent patents
- Transmission X-ray diffraction apparatus and related method7 Oct 2025US 12,436,115 B2Proto Patents Ltd.
- Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection24 Sep 2024US 12,099,025 B2The 59Th Institute of China Ordnance Industry
- Apparatus for inspecting semiconductor device and method for inspecting semiconductor device18 Jul 2023US 11,703,465 B2Kioxia Corporation
- Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction26 Jul 2022US 11,397,154 B2
- X-ray inspection device3 Aug 2021US 11,079,345 B2Rigaku Corporation
- Transmission x-ray diffraction apparatus and related method31 Aug 2023US 2023/0273134 A1Proto Patents Ltd.
- Device and method for measuring short-wavelength characteristic x-ray diffraction based on array detection29 Dec 2022US 2022/0412901 A1The 59Th Institute of China Ordnance Industry
- Apparatus for inspecting semiconductor device and method for inspecting semiconductor device3 Mar 2022US 2022/0065802 A1Kioxia Corporation
- X-ray inspection device4 Mar 2021US 2021/0063326 A1Rigaku Corporation
- Measurement of crystallite size distribution in polycrystalline materials using two-dimensional x-ray diffraction4 Feb 2021US 2021/0033546 A1Bruker AXS GmbH
Most cited
By later US patents
- Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry14US 9,001,968 B2GSI, Inc. · 2015
- Method of determining surface orientation of single crystal wafer4US 9,678,023 B2Korea Research Institute of Standards and Science · 2017
- X-ray inspection device2US 11,079,345 B2Rigaku Corporation · 2021
- Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction2US 11,397,154 B22022
- Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector2US 9,864,075 B22018