Transmission X-ray diffraction apparatus and related method

A method for characterizing a sample, the method comprising:

• generating a direct X-ray beam with an X-ray source, the direct X-ray beam being transmitted through the sample before being collected by a detector;
• conditioning the direct X-ray beam with an optical element positioned between the X-ray source and the detector, the optical element comprising a Montel optic and a secondary pin-hole collimator collectively adapted to focus the direct X-ray beam on the detector, wherein a ratio between a dimension of the direct X-ray beam projected on the detector and a sample-to-detector distance is equal or smaller than 1/570 and a ratio between a largest diagonal dimension of the detector and the sample-to-detector distance is greater than 1;
• and
• outputting an X-ray diffraction pattern.

A transmission X-ray diffraction (XRD) apparatus, the transmission XRD apparatus comprising:

• an X-ray source for irradiating a sample with an X-ray beam;
• a detector for receiving X-rays transmitted through the sample and outputting an X-ray diffraction pattern therefrom;
• an optical element positioned between the X-ray source and the detector, the optical element comprising a Montel optic and a secondary pin-hole collimator collectively adapted to focus the X-ray beam on the detector, wherein a ratio between a largest diagonal dimension of the detector and a sample-to-detector distance is greater than 1;
• and
• a motorized stage, comprising:
• a base;
• a goniometer head supported by the base;
• a sample holder for receiving the sample, the sample holder being mounted to the goniometer head, such that the sample is positioned to receive the X-ray beam when held by the sample holder;
• and
• a motor assembly in driving engagement with the goniometer head, the motor assembly being configured to impart a relative movement to the sample with respect to the X-ray source and the detector.