Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection
AssigneeThe 59Th Institute of China Ordnance Industry
InventorsLin Zheng, Shitao Dou, Xin Chen, Lunwu Zhang, Jin Zhang, Taibin Wu, Luchang Che, Chengzhang Wang, Kun Zhou, Fangchao Zhao, Changguang He, Xianhe Feng
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