Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry

A method for characterizing spectrometric properties of bent crystal comprising:

• a) positioning a spherically bent crystal that is suitable to image K-alpha and reflect He-alpha characteristic x-ray emission spectra of a target substance disposed on a rotatable mount on a Rowland circle in the path of x-ray emissions from the target substance wherein a reflective surface of the spherically bent crystal is disposed at approximately the Bragg angle to the path;
• b) exciting the target substance sufficient to generate x-ray emissions to impinge upon the spherically bent crystal;
• thereupon
• c) capturing and recording intensity of He-alpha x-ray emissions as diverted by the spherically bent crystal at an off-angle to direct x-ray emission reflections;
• d) incrementally rotating the spherically bent crystal about its reflective center of rotation;
• e) repeating steps b), c) and d) to build a rocking curve of x-ray reflections off-angle to the direct x-ray emission reflections;
• f) using the He-alpha x-ray emission spectrum to make a rocking curve at angles far from normal incidence that characterizes the crystal at the K-alpha x-ray emission spectrum of a lower energy level, and characterized by a larger Bragg angle, for use as an imaging optic at the K-alpha x-ray emission spectrum at angles close to normal incidence wherein the Bragg angles are between approximately 80 degrees and 89 degrees.