G01B 15/04
Measuring arrangements characterised by the use of electromagnetic waves or particle radiation
Official title: for measuring contours or curvatures
G01B15/04 (Measuring arrangements characterised by the use of electromagnetic waves or particle radiation) appears on 298 US grants and 303 published applications in this corpus.
Search patents in G01B- Granted patents
- 298
- Published applications
- 303
- Assignees
- 182
- Inventors
- 752
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 4 | 0 |
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 4 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 3 | 0 |
| 1995 | 7 | 0 |
| 1996 | 3 | 0 |
| 1997 | 3 | 0 |
| 1998 | 2 | 0 |
| 1999 | 3 | 0 |
| 2000 | 4 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 2 |
| 2003 | 2 | 1 |
| 2004 | 3 | 4 |
| 2005 | 0 | 4 |
| 2006 | 3 | 1 |
| 2007 | 2 | 4 |
| 2008 | 3 | 8 |
| 2009 | 5 | 3 |
| 2010 | 2 | 3 |
| 2011 | 4 | 7 |
| 2012 | 10 | 11 |
| 2013 | 4 | 11 |
| 2014 | 8 | 8 |
| 2015 | 10 | 14 |
| 2016 | 9 | 12 |
| 2017 | 13 | 20 |
| 2018 | 15 | 19 |
| 2019 | 18 | 17 |
| 2020 | 23 | 29 |
| 2021 | 15 | 31 |
| 2022 | 21 | 27 |
| 2023 | 18 | 20 |
| 2024 | 31 | 22 |
| 2025 | 23 | 15 |
| 2026 | 8 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Techniques for improved critical dimension metrology6 Oct 2026US 12,754,013 B2Uchicago Argonne, LLC
- Measurement system, inspection system, measurement device, measurement method, inspection method, and program14 Jul 2026US 12,682,473 B2OMRON Corporation
- Methods and systems for tomographic microscopy imaging14 Jul 2026US 12,683,116 B2FEI Company
- Method for determining a contour of an object7 Jul 2026US 12,674,663 B2Aptiv Technologies AG
- Analysis system9 Jun 2026US 12,651,724 B2Hitachi High-Tech Corporation
- Method for scanning an object in a scanning apparatus8 Oct 2026US 2026/0309651 A1ROLLS-ROYCE plc
- Radar-based determination of tyre parameters3 Sep 2026US 2026/0259046 A1Volvo Truck Corporation
- Method and Radar Device for a Radar-Based Size Classification of Objects, and Correspondingly Designed Motor Vehicle27 Aug 2026US 2026/0251448 A1Bayerische Motoren Werke Aktiengesellschaft
- Coronary artery bifurcation geometry measurement systems and methods6 Aug 2026US 2026/0228371 A1Board of Trustees of the University of Arkansas
- Method for scanning a component18 Jun 2026US 2026/0168941 A1ROLLS-ROYCE plc
Most cited
By later US patents
- Contour radiography: a system for determining 3-dimensional contours of an object from its 2-dimensional images94US 4,630,203 A1986
- Scanning electron microscope and method for production of semiconductor device by using the same90US 5,412,210 AHitachi, Ltd. · 1995
- Electro-optical system for gauging surface profile deviations using infrared radiation79US 5,463,464 AKMS Fusion, Inc. · 1995
- Focused ion beam metrology75US 5,798,529 AInternational Business Machines Corporation · 1998
- Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects72US 4,725,963 AScientific Measurement Systems I, Ltd. · 1988