G01B 15/045
By measuring absorption
Official title: {by measuring absorption}
G01B15/045 (By measuring absorption) appears on 55 US grants and 45 published applications in this corpus.
Search patents in G01B- Granted patents
- 55
- Published applications
- 45
- Assignees
- 54
- Inventors
- 151
- Latest grant
- 4 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 2 | 1 |
| 2013 | 0 | 2 |
| 2014 | 1 | 1 |
| 2015 | 1 | 2 |
| 2016 | 0 | 2 |
| 2017 | 0 | 0 |
| 2018 | 1 | 2 |
| 2019 | 3 | 1 |
| 2020 | 3 | 12 |
| 2021 | 5 | 7 |
| 2022 | 5 | 3 |
| 2023 | 8 | 4 |
| 2024 | 6 | 2 |
| 2025 | 4 | 2 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof4 Nov 2025US 12,461,039 B2The Australian National University
- Computer-implemented method for monitoring the status of a device for investigating objects26 Aug 2025US 12,399,137 B2Volume Graphics GmbH
- Method and system utilizing imaging analysis for golf balls24 Jun 2025US 12,337,215 B1Topgolf Callaway Brands Corp.
- Method for monitoring and/or calibrating a device designed for the three-dimensional X-ray optical inspection of seedlings in different growth phases21 Jan 2025US 12,203,878 B2Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
- Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement4 Jun 2024US 11,998,382 B2National Institute of Advanced Industrial Science and Technology
- Method for scanning a component18 Jun 2026US 2026/0168941 A1ROLLS-ROYCE plc
- Apparatus and method for measuring clearance11 Jun 2026US 2026/0160546 A1ROLLS-ROYCE plc
- Method of calculating indicator of thin wire, method of evaluating quality of optical cable, and optical cable13 Nov 2025US 2025/0347584 A1Sumitomo Electric Industries, Ltd.
- Method, system and computer program for the x-ray inspection of a part2 Oct 2025US 2025/0308013 A1Centre National de la Recherche Scientifique (CNRS)
- Inspection system, inspection management device, inspecting method, and program6 Jun 2024US 2024/0183792 A1OMRON Corporation
Most cited
By later US patents
- Electro-optical system for gauging surface profile deviations using infrared radiation79US 5,463,464 AKMS Fusion, Inc. · 1995
- Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects72US 4,725,963 AScientific Measurement Systems I, Ltd. · 1988
- Method and apparatus for imaging obscured areas of a test object35US 5,594,770 AThermoSpectra Corporation · 1997
- Image generating apparatus, imaging system including image generating apparatus and operating method of imaging system31US 11,049,293 B2Electronics and Telecommunications Research Institute · 2021
- Strip profile measurement29US 4,047,036 AHeath (Gloucester) Ltd. · 1977