Method for monitoring and/or calibrating a device designed for the three-dimensional X-ray optical inspection of seedlings in different growth phases

Abstract

A method for monitoring and/or calibrating a device designed for three-dimensional X-ray optical inspection of seedlings in different growth phases may optically or X-ray optically measure natural seedlings in three dimensions at predetermined times during their growth phase. The method may create a control program for a device which is designed for the three-dimensional printing of artificial seedlings as reference samples which are replicas of the natural seedlings in each case using the recorded measured values. The method may also produce artificial seedlings with a plastic using the device in accordance with the created control program. The artificial seedlings thus produced may be measured three-dimensionally by X-ray optics and the measured values thus acquired may be recorded in a control chart or an already created control chart is adapted, with which control chart monitoring and/or calibration of the device designed for the three-dimensional X-ray optical inspection of seedlings is performed.

Dependencies are inferred from the claim text.