Method for scanning a component
AssigneeROLLS-ROYCE plc
InventorAkhil MULLOTH
Life of this patent
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Abstract
A method for scanning a component having one or more regions of interest includes disposing at least one element adjacent to and at least partially engaging the one or more regions of interest of the component. The component has an aspect ratio that is higher than an aspect ratio of the at least one element. The method further includes providing an imaging beam source and an imaging beam receiver; generating, via the imaging beam source, an imaging beam that passes through the component and the at least one element; receiving the imaging beam at the imaging beam receiver; and generating, via the imaging beam receiver, an image.
Claims20
A method for scanning a component having one or more regions of interest, the method comprising the steps of:
- disposing at least one element adjacent to and at least partially engaging the one or more regions of interest of the component, wherein the component has an aspect ratio that is higher than an aspect ratio of the at least one element;
- providing an imaging beam source and an imaging beam receiver, such that the component and the at least one element are placed between the imaging beam source and the imaging beam receiver;
- generating, via the imaging beam source, an imaging beam that passes through the component and the at least one element;
- receiving the imaging beam at the imaging beam receiver;
- and
- generating, via the imaging beam receiver, an image in response to receiving the imaging beam, the image depicting a contrast between the at least one element and the one or more regions of interest of the component due to lower aspect ratio of the at least one element than that of the component.
Dependencies are inferred from the claim text.