Inspection system, inspection management device, inspecting method, and program
AssigneeOMRON Corporation
InventorTakako ONISHI
Life of this patent
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AssigneeOMRON Corporation
InventorTakako ONISHI
Estimating the term…
An inspection system includes a first inspection unit configured to perform a first inspection based on first image data obtained by imaging an inspection target by a first imaging unit, a second inspection unit configured to perform a second inspection based on second image data obtained by imaging the inspection target by a second imaging unit different from the first imaging unit, a first inspection information acquisition unit configured to acquire first inspection information including a result of the first inspection from the first inspection unit, a validity judgment unit configured to judge, based on a predetermined judgment condition, a validity of performing the second inspection on the inspection target by the second inspection unit, and a second inspection execution determination unit configured to determine, based on the judgment by the validity judgment unit, at least a necessity of performing the second inspection.
An inspection system comprising:
An inspection management apparatus that is a management apparatus of an inspection system including a first inspection unit configured to perform a first inspection on the basis of first image data obtained by imaging an inspection target by a first imaging unit, and a second inspection unit configured to perform a second inspection on the basis of second image data obtained by imaging the inspection target by a second imaging unit different from the first imaging unit, the inspection management apparatus comprising:
An inspection method comprising:
Dependencies are inferred from the claim text.