Method, system and computer program for the x-ray inspection of a part
AssigneesCentre National de la Recherche Scientifique (CNRS), Safran, Ecole Normale Superieure Paris-Saclay
InventorsCédric FRAGNAUD, Clément REMACHA, Stéphane ROUX, Julian BETANCUR
Life of this patent
Estimating the term…