QualiTau, Inc.
Santa Clara, CA, US· latest recorded location
QualiTau, Inc. is named on 31 US grants and 21 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 31
- Published applications
- 21
- Inventors
- 23
- Granted in 2026 so far
- 0
- Most recent grant
- 5 Nov 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 2 | 0 |
| 2001 | 2 | 0 |
| 2002 | 1 | 1 |
| 2003 | 2 | 2 |
| 2004 | 2 | 1 |
| 2005 | 0 | 2 |
| 2006 | 5 | 0 |
| 2007 | 1 | 1 |
| 2008 | 2 | 3 |
| 2009 | 5 | 1 |
| 2010 | 1 | 2 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 1 | 0 |
| 2016 | 0 | 1 |
| 2017 | 1 | 2 |
| 2018 | 0 | 3 |
| 2019 | 0 | 0 |
| 2020 | 1 | 0 |
| 2021 | 3 | 1 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
By publication year.
Technology areas
Share of 52 documents
- G01RMeasuring electric variables42
- H01RElectrically-conductive connections10
- H10PGeneric processes or apparatus for the manufacture or treatment of devices covered5
- G01KMeasuring temperature2
- H02HEmergency protective circuit arrangements2
- H03FAmplifiers2
- H03KPulse technique2
- H05KPrinted circuits2
- Y02EClean energy generation and storage2
- Y10TTechnical subjects covered by former us classification2
Recent patents
- Semi-automatic prober5 Nov 2024US 12,135,335 B2
- Semi-automatic prober16 Nov 2021US 11,175,309 B2
- System and method for limiting voltage6 Jul 2021US 11,054,444 B2
- Universal probing assembly with five degrees of freedom12 Jan 2021US 10,890,602 B2
- Signal distribution apparatus23 Jun 2020US 10,690,715 B2
- Semi-automatic prober23 Dec 2021US 2021/0396785 A1
- Signal distribution apparatus8 Nov 2018US 2018/0321300 A1
- Universal probing assembly with five degrees of freedom21 Jun 2018US 2018/0172731 A1
- Current sense overload limiting circuit21 Jun 2018US 2018/0172734 A1
- Pulsed current source with internal impedance matching11 May 2017US 2017/0131326 A1
Most cited
By later US patents
- Vertical probe card and air cooled probe head system18US 7,126,361 B12006
- Test socket for packaged semiconductor devices17US 6,798,228 B22004
- High temperature ceramic socket configured to test packaged semiconductor devices11US 7,602,201 B22009
- Apparatus and method for probing multiple integrated circuit dice in a semiconductor wafer9US 6,011,405 A2000
- Automatic range finder for electric current testing9US 7,098,648 B22006